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2020 – today
- 2021
[j5]Mathieu Dumont, Mathieu Lisart, Philippe Maurine
:
Modeling and Simulating Electromagnetic Fault Injection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(4): 680-693 (2021)
2010 – 2019
- 2019
- [c15]Mathieu Dumont, Mathieu Lisart, Philippe Maurine:
Electromagnetic Fault Injection : How Faults Occur. FDTC 2019: 9-16 - 2015
- [j4]Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Jean-Max Dutertre, Alexandre Sarafianos:
Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation. Microelectron. Reliab. 55(9-10): 1592-1599 (2015) - [c14]Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre:
Influence of triple-well technology on laser fault injection and laser sensor efficiency. DFTS 2015: 85-90 - [c13]Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos:
SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology. DFTS 2015: 177-182 - [c12]Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos:
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents. IOLTS 2015: 150-155 - [c11]Nicolas Borrel, Clement Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, Wenceslas Rahajandraibe, Jean-Max Dutertre:
Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation. IRPS 2015: 1 - 2014
- [c10]Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale:
Laser attacks on integrated circuits: From CMOS to FD-SOI. DTIS 2014: 1-6 - [c9]Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier:
Laser-induced fault effects in security-dedicated circuits. VLSI-SoC 2014: 1-6 - [c8]Paolo Maistri, Régis Leveugle, Lilian Bossuet, Alain Aubert, Viktor Fischer, Bruno Robisson, Nicolas Moro, Philippe Maurine, Jean-Max Dutertre, Mathieu Lisart:
Electromagnetic analysis and fault injection onto secure circuits. VLSI-SoC 2014: 1-6 - 2013
- [j3]Alexandre Sarafianos, Cyril Roscian, Jean-Max Dutertre, Mathieu Lisart, Assia Tria:
Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell. Microelectron. Reliab. 53(9-11): 1300-1305 (2013) - [c7]Alexandre Sarafianos, Mathieu Lisart, Olivier Gagliano, Valerie Serradeil, Cyril Roscian, Jean-Max Dutertre, Assia Tria:
Robustness improvement of an SRAM cell against laser-induced fault injection. DFTS 2013: 149-154 - [c6]Karim Tobich, Philippe Maurine, Pierre-Yvan Liardet, Mathieu Lisart, Thomas Ordas:
Voltage Spikes on the Substrate to Obtain Timing Faults. DSD 2013: 483-486 - 2012
- [j2]Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis:
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology. Microelectron. Reliab. 52(9-10): 2035-2038 (2012) - 2011
- [c5]François Poucheret, Karim Tobich, Mathieu Lisart, Laurent Chusseau, Bruno Robisson, Philippe Maurine:
Local and Direct EM Injection of Power Into CMOS Integrated Circuits. FDTC 2011: 100-104 - 2010
- [c4]Victor Lomné, Philippe Maurine, Lionel Torres, Thomas Ordas, Mathieu Lisart, Jérome Toublanc:
Modeling Time Domain Magnetic Emissions of ICs. PATMOS 2010: 238-249
2000 – 2009
- 2009
- [j1]C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart:
Electrical modeling of the effect of beam profile for pulsed laser fault injection. Microelectron. Reliab. 49(9-11): 1143-1147 (2009) - 2008
- [c3]Thomas Ordas, Mathieu Lisart, Etienne Sicard, Philippe Maurine, Lionel Torres:
Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits. PATMOS 2008: 229-236 - 2007
- [c2]Julien Mercier, Christian Dufaza, Mathieu Lisart:
Signoff power methodology for contactless smartcards. ISLPED 2007: 407-410 - 2006
- [c1]Julien Mercier, Christian Dufaza, Mathieu Lisart:
Methodology for Dynamic Power Verification of Contactless Smartcards. PATMOS 2006: 280-291
Coauthor Index
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