"Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of ..."

Jean-Max Dutertre et al. (2018)

> Home

Details and statistics

DOI: 10.1109/FDTC.2018.00009

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/fdtc/DutertreBCCFFGH18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/fdtc/DutertreBCCFFGH18
Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Stephan De Castro, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre:
Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model. FDTC 2018: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.