"Evaluation of radiation-induced soft error in majority voters designed in ..."

Y. Q. de Aguiar et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.077

access: closed

type: Journal Article

metadata version: 2020-02-22

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Y. Q. de Aguiar, Laurent Artola, Guillaume Hubert, Cristina Meinhardt, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology. Microelectron. Reliab. 76-77: 660-664 (2017)

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