"Circuit-Level Techniques to Mitigate Process Variability and Soft Errors ..."

Alexandra L. Zimpeck et al. (2019)

> Home

Details and statistics

DOI: 10.1109/VLSI-SOC.2019.8920383

access: closed

type: Conference or Workshop Paper

metadata version: 2020-06-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsi/ZimpeckMAHKR19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsi/ZimpeckMAHKR19
Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs. VLSI-SoC 2019: 240-241

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.