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ORCIDLeonardo Heitich Brendler
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- affiliation: Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
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2020 – today
- 2023
[j2]Leonardo Heitich Brendler
, Hervé Lapuyade, Yann Deval, Frédéric Darracq, Frédéric Fauquet, Ricardo Reis, François Rivet:
A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications. IEEE Trans. Circuits Syst. I Regul. Pap. 70(12): 4877-4887 (2023)- [c13]Leonardo Heitich Brendler, Hervé Lapuyade, Yann Deval, Ricardo Reis, François Rivet:
A Tool for Automatic Radiation-Hardened SRAM Layout Generation. ICECS 2023: 1-4 - [c12]Bernardo Borges Sandoval, Leonardo Heitich Brendler, Fernanda Lima Kastensmidt, Ricardo Reis, Alexandra L. Zimpeck, Rafael B. Schvittz, Cristina Meinhardt:
Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation. ISCAS 2023: 1-5 - [c11]Leonardo Heitich Brendler, Hervé Lapuyade, Yann Deval, Ricardo Reis, François Rivet:
A MCU-robust Interleaved Data/Detection SRAM for Space Environments. ISVLSI 2023: 1-6 - [c10]Cleiton Magano Marques, Leonardo Heitich Brendler, Frédéric Wrobel, Alexandra L. Zimpeck, Walter E. Calienes Bartra, Paulo F. Butzen, Cristina Meinhardt:
A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures. SBCCI 2023: 1-6 - 2021
- [c9]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Cristina Meinhardt, Ricardo A. L. Reis:
Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit. LASCAS 2021: 1-4 - [c8]Bernardo Borges Sandoval, Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Ricardo Reis, Cristina Meinhardt:
Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study. LATS 2021: 1-6 - 2020
- [j1]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology. IEEE Trans. Circuits Syst. I Regul. Pap. 67-I(2): 553-564 (2020) - [c7]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters. LATS 2020: 1-6 - [c6]Ricardo A. L. Reis, Cristina Meinhardt, Alexandra L. Zimpeck, Leonardo Heitich Brendler, Leonardo B. Moraes:
Circuit Level Design Methods to Mitigate Soft Errors. LATS 2020: 1-3
2010 – 2019
- 2019
- [c5]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Process Variability Impact on the SET Response of FinFET Multi-level Design. VLSI-SoC (Selected Papers) 2019: 89-113 - [c4]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis:
Evaluation of SET under Process Variability on FinFET Multi-level Design. VLSI-SoC 2019: 179-184 - [c3]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis:
Impact of Process Variability and Single Event Transient on FinFET Technology. VLSI-SoC 2019: 249-250 - 2018
- [c2]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells. ICECS 2018: 581-584 - [c1]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements. VLSI-SoC 2018: 71-76
Coauthor Index
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