"Voltage Scaling Influence on the Soft Error Susceptibility of a ..."

Leonardo Heitich Brendler et al. (2021)

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DOI: 10.1109/LASCAS51355.2021.9459127

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Cristina Meinhardt, Ricardo A. L. Reis:
Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit. LASCAS 2021: 1-4

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