"Impact of Process Variability and Single Event Transient on FinFET Technology."

Leonardo Heitich Brendler et al. (2019)

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DOI: 10.1109/VLSI-SOC.2019.8920355

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis:
Impact of Process Variability and Single Event Transient on FinFET Technology. VLSI-SoC 2019: 249-250

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