"A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures."

Cleiton Magano Marques et al. (2023)

> Home

Details and statistics

DOI: 10.1109/SBCCI60457.2023.10261665

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/sbcci/MarquesBWZBBM23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/sbcci/MarquesBWZBBM23
Cleiton Magano Marques, Leonardo Heitich Brendler, Frédéric Wrobel, Alexandra L. Zimpeck, Walter E. Calienes Bartra, Paulo F. Butzen, Cristina Meinhardt:
A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures. SBCCI 2023: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.