"Process variability in FinFET standard cells with different transistor ..."

Alexandra L. Zimpeck et al. (2015)

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DOI: 10.1109/ICECS.2015.7440264

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-22

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Alexandra L. Zimpeck, Cristina Meinhardt, Gracieli Posser, Ricardo Reis:
Process variability in FinFET standard cells with different transistor sizing techniques. ICECS 2015: 121-124

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