"Predictive evaluation of electrical characteristics of sub-22 nm FinFET ..."

Cristina Meinhardt, Alexandra L. Zimpeck, Ricardo A. L. Reis (2014)

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DOI: 10.1016/J.MICROREL.2014.07.023

access: closed

type: Journal Article

metadata version: 2020-02-22

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Cristina Meinhardt, Alexandra L. Zimpeck, Ricardo A. L. Reis:
Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations. Microelectron. Reliab. 54(9-10): 2319-2324 (2014)

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