default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDKanak Agarwal 0001
Person information
- affiliation: Arm Research
- affiliation: IBM Research Division, Austin Research Lab, Austin, TX, USA
Other persons with the same name
- Kanak Agarwal 0002
![[0009-0003-9509-1557]](https://dblp.uni-trier.de./img/orcid-mark.12x12.png "0009-0003-9509-1557")
— Manipal Institute of Technology, Department of Aeronautical and Automobile Engineering, India
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2020
[c61]Alexandre Ferreira, Eric Van Hensbergen, Chris Adeniyi-Jones, Edmund Grimley-Evans, Josh Minor, Mark Nutter, Luis E. Peña, Kanak Agarwal, Jon Hermes:
SMARTER: Experiences with Cloud Native on the Edge. HotEdge 2020
2010 – 2019
- 2016
- [j13]Ahmed Gheith, Ramakrishnan Rajamony, Patrick J. Bohrer, Kanak Agarwal, Michael Kistler, B. L. White Eagle, C. A. Hambridge, John B. Carter, T. Kaplinger:
IBM Bluemix Mobile Cloud Services. IBM J. Res. Dev. 60(2-3) (2016) - [c60]Keqiang He, Eric Rozner, Kanak Agarwal, Yu (Jason) Gu, Wes Felter, John B. Carter, Aditya Akella:
AC/DC TCP: Virtual Congestion Control Enforcement for Datacenter Networks. SIGCOMM 2016: 244-257 - 2015
- [c59]Raphael Robertazzi, Kanak Agarwal, Bucknell Webb, Christy Tyberg:
TSV/FET proximity study using dense addressable transistor arrays. IRPS 2015: 3 - [c58]Keqiang He, Eric Rozner, Kanak Agarwal, Wes Felter, John B. Carter, Aditya Akella:
Presto: Edge-based Load Balancing for Fast Datacenter Networks. SIGCOMM 2015: 465-478 - 2014
- [c57]Kanak Agarwal:
Wire-Speed Differential SOAP Encoding. ICWS 2014: 217-224 - [c56]Jeff Rasley, Brent E. Stephens, Colin Dixon, Eric Rozner, Wes Felter, Kanak Agarwal, John B. Carter, Rodrigo Fonseca:
Low-latency Network Monitoring via Oversubscribed Port Mirroring. ONS 2014 - [c55]Kanak Agarwal, Eric Rozner, Colin Dixon, John B. Carter:
SDN traceroute: tracing SDN forwarding without changing network behavior. HotSDN 2014: 145-150 - [c54]Kanak Agarwal, Colin Dixon, Eric Rozner, John B. Carter:
Shadow MACs: scalable label-switching for commodity ethernet. HotSDN 2014: 157-162 - [c53]Jeff Rasley, Brent E. Stephens, Colin Dixon, Eric Rozner, Wes Felter, Kanak Agarwal, John B. Carter, Rodrigo Fonseca:
Planck: millisecond-scale monitoring and control for commodity networks. SIGCOMM 2014: 407-418 - 2013
- [j12]Rani S. Ghaida, Kanak B. Agarwal, Sani R. Nassif, Xin Yuan, Lars Liebmann, Puneet Gupta:
Layout Decomposition and Legalization for Double-Patterning Technology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(2): 202-215 (2013) - [c52]Kanak Agarwal, Raphael Polig:
A high-speed and large-scale dictionary matching engine for Information Extraction systems. ASAP 2013: 59-66 - 2012
- [c51]Vivek Joshi, Kanak Agarwal, Dennis Sylvester:
Design-patterning co-optimization of SRAM robustness for double patterning lithography. ASP-DAC 2012: 713-718 - [c50]Kanak B. Agarwal, Shayak Banerjee:
Design driven patterning optimizations for low K1 lithography. ICICDT 2012: 1-4 - [c49]Rani S. Ghaida, Kanak B. Agarwal, Sani R. Nassif, Xin Yuan, Lars W. Liebmann, Puneet Gupta:
O(n) layout-coloring for multiple-patterning lithography and conflict-removal using compaction. ICICDT 2012: 1-4 - [c48]Shayak Banerjee, Kanak B. Agarwal, Sani R. Nassif:
Design-aware lithography. ISPD 2012: 3-8 - 2011
- [c47]Shayak Banerjee, Kanak B. Agarwal, Sani R. Nassif:
Electrically-driven retargeting for nanoscale layouts. CICC 2011: 1-4 - [c46]Jim Aarestad, Charles Lamech, Jim Plusquellic, Dhruva Acharyya, Kanak Agarwal:
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect. DAC 2011: 534-539 - [c45]Rani S. Ghaida, Kanak B. Agarwal, Sani R. Nassif, Xin Yuan, Lars Liebmann, Puneet Gupta:
A framework for double patterning-enabled design. ICCAD 2011: 14-20 - [c44]Charles Lamech, Jim Aarestad, Jim Plusquellic, Reza M. Rad, Kanak Agarwal:
REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations. ICCAD 2011: 170-177 - [c43]Rouwaida Kanj, Tong Li, Rajiv V. Joshi, Kanak Agarwal, Ali Sadigh, David Winston, Sani R. Nassif:
Accelerated statistical simulation via on-demand Hermite spline interpolations. ICCAD 2011: 353-360 - [c42]Shayak Banerjee, Kanak B. Agarwal, Sani R. Nassif, James A. Culp, Lars Liebmann, Michael Orshansky:
Coupling timing objectives with optical proximity correction for improved timing yield. ISQED 2011: 97-102 - [c41]Jim Plusquellic, Dhruva Acharyya, Kanak Agarwal:
Measuring within-die spatial variation profile through power supply current measurements. ISQED 2011: 711-715 - 2010
- [j11]Vivek Joshi, Brian Cline, Dennis Sylvester, David T. Blaauw, Kanak Agarwal:
Mechanical Stress Aware Optimization for Leakage Power Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(5): 722-736 (2010) - [j10]Harmander Singh, Rahul M. Rao, Kanak Agarwal, Dennis Sylvester, Richard B. Brown:
Dynamically Pulsed MTCMOS With Bus Encoding for Reduction of Total Power and Crosstalk Noise. IEEE Trans. Very Large Scale Integr. Syst. 18(1): 166-170 (2010) - [c40]Vivek Joshi, Kanak Agarwal, Dennis Sylvester, David T. Blaauw:
Analyzing electrical effects of RTA-driven local anneal temperature variation. ASP-DAC 2010: 739-744 - [c39]Shayak Banerjee, Kanak B. Agarwal, Michael Orshansky:
Ground rule slack aware tolerance-driven optical proximity correction for local metal interconnects. CICC 2010: 1-4 - [c38]Kanak Agarwal:
Frequency domain decomposition of layouts for double dipole lithography. DAC 2010: 404-407 - [c37]Vivek Joshi, Valeriy Sukharev, Andres Torres, Kanak Agarwal, Dennis Sylvester, David T. Blaauw:
Closed-form modeling of layout-dependent mechanical stress. DAC 2010: 673-678 - [c36]Shayak Banerjee, Kanak B. Agarwal, Chin Ngai Sze, Sani R. Nassif, Michael Orshansky:
A methodology for propagating design tolerances to shape tolerances for use in manufacturing. DATE 2010: 1273-1278 - [c35]Kanak Agarwal:
On-die sensors for measuring process and environmental variations in integrated circuits. ACM Great Lakes Symposium on VLSI 2010: 147-150 - [c34]Vivek Joshi, Kanak Agarwal, David T. Blaauw, Dennis Sylvester:
Analysis and optimization of SRAM robustness for double patterning lithography. ICCAD 2010: 25-31 - [c33]Shayak Banerjee, Kanak B. Agarwal, Michael Orshansky:
SMATO: Simultaneous mask and target optimization for improving lithographic process window. ICCAD 2010: 100-106 - [c32]Cheng Zhuo, Kanak Agarwal, David T. Blaauw, Dennis Sylvester:
Active learning framework for post-silicon variation extraction and test cost reduction. ICCAD 2010: 508-515 - [c31]Vivek Joshi, Kanak Agarwal, Dennis Sylvester:
Simultaneous extraction of effective gate length and low-field mobility in non-uniform devices. ISQED 2010: 158-162 - [c30]Dhruva Acharyya, Kanak Agarwal, Jim Plusquellic:
Leveraging existing power control circuits and power delivery architecture for variability measurement. ITC 2010: 645-653
2000 – 2009
- 2009
- [c29]Kanak Agarwal, Dhruva Acharyya, Jim Plusquellic:
Characterizing within-die variation from multiple supply port IDDQ measurements. ICCAD 2009: 418-424 - [c28]Nancy Ying Zhou, Rouwaida Kanj, Kanak Agarwal, Zhuo Li, Rajiv V. Joshi, Sani R. Nassif, Weiping Shi:
The impact of BEOL lithography effects on the SRAM cell performance and yield. ISQED 2009: 607-612 - 2008
- [j9]Dennis Sylvester, Kanak Agarwal, Saumil Shah:
Variability in nanometer CMOS: Impact, analysis, and minimization. Integr. 41(3): 319-339 (2008) - [j8]Kanak Agarwal, Sani R. Nassif:
The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies. IEEE Trans. Very Large Scale Integr. Syst. 16(1): 86-97 (2008) - [c27]Kevin J. Nowka, Sani R. Nassif, Kanak Agarwal:
Characterization and design for variability and reliability. CICC 2008: 341-346 - [c26]Vivek Joshi, Brian Cline, Dennis Sylvester, David T. Blaauw, Kanak Agarwal:
Leakage power reduction using stress-enhanced layouts. DAC 2008: 912-917 - [c25]Vivek Joshi, Brian Cline, Dennis Sylvester, David T. Blaauw, Kanak Agarwal:
Stress aware layout optimization. ISPD 2008: 168-174 - [c24]Victoria Wang, Kanak Agarwal, Sani R. Nassif, Kevin J. Nowka, Dejan Markovic:
A Design Model for Random Process Variability. ISQED 2008: 734-737 - 2007
- [j7]Kanak Agarwal, Rahul M. Rao, Dennis Sylvester, Richard B. Brown:
Parametric Yield Analysis and Optimization in Leakage Dominated Technologies. IEEE Trans. Very Large Scale Integr. Syst. 15(6): 613-623 (2007) - [j6]Harmander Singh, Kanak Agarwal, Dennis Sylvester, Kevin J. Nowka:
Enhanced Leakage Reduction Techniques Using Intermediate Strength Power Gating. IEEE Trans. Very Large Scale Integr. Syst. 15(11): 1215-1224 (2007) - [c23]Kanak Agarwal, Sani R. Nassif:
Characterizing Process Variation in Nanometer CMOS. DAC 2007: 396-399 - [c22]Wei Zhao, Yu Cao, Frank Liu, Kanak Agarwal, Dhruva Acharyya, Sani R. Nassif, Kevin J. Nowka:
Rigorous extraction of process variations for 65nm CMOS design. ESSCIRC 2007: 89-92 - [c21]Kanak Agarwal, Frank Liu:
Efficient computation of current flow in signal wires for reliability analysis. ICCAD 2007: 741-746 - [c20]Kanak Agarwal, Kevin J. Nowka:
Dynamic Power Management by Combination of Dual Static Supply Voltages. ISQED 2007: 85-92 - 2006
- [j5]Kanak Agarwal, Dennis Sylvester, David T. Blaauw:
Modeling and analysis of crosstalk noise in coupled RLC interconnects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(5): 892-901 (2006) - [j4]Kanak Agarwal, Mridul Agarwal, Dennis Sylvester, David T. Blaauw:
Statistical interconnect metrics for physical-design optimization. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(7): 1273-1288 (2006) - [c19]Kanak Agarwal, Sani R. Nassif:
Statistical analysis of SRAM cell stability. DAC 2006: 57-62 - [c18]Emrah Acar, Kanak Agarwal, Sani R. Nassif:
Characterization of total chip leakage using inverse (reciprocal) gamma distribution. ISCAS 2006 - [c17]Sani R. Nassif, Kanak Agarwal, Emrah Acar:
Methods for estimating decoupling capacitance of nonswitching circuit blocks. ISCAS 2006 - [c16]Kanak Agarwal, Kevin J. Nowka, Harmander Deogun, Dennis Sylvester:
Power Gating with Multiple Sleep Modes. ISQED 2006: 633-637 - 2005
- [c15]Kanak Agarwal, Dennis Sylvester, David T. Blaauw, Anirudh Devgan:
Achieving continuous VT performance in a dual VT process. ASP-DAC 2005: 393-398 - [c14]Mridul Agarwal, Kanak Agarwal, Dennis Sylvester, David T. Blaauw:
Statistical modeling of cross-coupling effects in VLSI interconnects. ASP-DAC 2005: 503-506 - [c13]Ashish Srivastava, Saumil Shah, Kanak Agarwal, Dennis Sylvester, David T. Blaauw, Stephen W. Director:
Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance. DAC 2005: 535-540 - [c12]Rahul M. Rao, Kanak Agarwal, Dennis Sylvester, Himanshu Kaul, Richard B. Brown, Sani R. Nassif:
Power-aware global signaling strategies. ISCAS (1) 2005: 604-607 - [c11]Rahul M. Rao, Kanak Agarwal, Anirudh Devgan, Kevin J. Nowka, Dennis Sylvester, Richard B. Brown:
Parametric Yield Analysis and Constrained-Based Supply Voltage Optimization. ISQED 2005: 284-290 - 2004
- [j3]Kanak Agarwal, Dennis Sylvester, David T. Blaauw:
A library compatible driver output model for on-chip RLC transmission lines. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(1): 128-136 (2004) - [j2]Kanak Agarwal, Dennis Sylvester, David T. Blaauw:
A simple metric for slew rate of RC circuits based on two circuit moments. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(9): 1346-1354 (2004) - [c10]Kanak Agarwal, Dennis Sylvester, David T. Blaauw:
A simplified transmission-line based crosstalk noise model for on-chip RLC wiring. ASP-DAC 2004: 858-864 - [c9]Kanak Agarwal, Dennis Sylvester, David T. Blaauw, Frank Liu, Sani R. Nassif, Sarma B. K. Vrudhula:
Variational delay metrics for interconnect timing analysis. DAC 2004: 381-384 - [c8]Saumil Shah, Kanak Agarwal, Dennis Sylvester:
A New Threshold Voltage Assignment Scheme for Runtime Leakage Reduction in On-Chip Repeaters. ICCD 2004: 138-143 - [c7]Rahul M. Rao, Kanak Agarwal, Dennis Sylvester, Richard B. Brown, Kevin J. Nowka, Sani R. Nassif:
Approaches to run-time and standby mode leakage reduction in global buses. ISLPED 2004: 188-193 - 2003
- [j1]Takashi Sato, Yu Cao, Kanak Agarwal, Dennis Sylvester, Chenming Hu:
Bidirectional closed-form transformation between on-chip coupling noise waveforms and interconnect delay-change curves. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(5): 560-572 (2003) - [c6]Kanak Agarwal, Dennis Sylvester, David T. Blaauw:
An effective capacitance based driver output model for on-chip RLC interconnects. DAC 2003: 376-381 - [c5]Kanak Agarwal, Dennis Sylvester, David T. Blaauw:
Simple metrics for slew rate of RC circuits based on two circuit moments. DAC 2003: 950-953 - [c4]Shidhartha Das, Kanak Agarwal, David T. Blaauw, Dennis Sylvester:
Optimal Inductance for On-chip RLC Interconnections. ICCD 2003: 264- - [c3]Kanak Agarwal, Dennis Sylvester, David T. Blaauw:
Dynamic clamping: on-chip dynamic shielding and termination for high-speed RLC buses. SoC 2003: 97-100 - 2002
- [c2]Kanak Agarwal, Dennis Sylvester, David T. Blaauw:
A library compatible driving point model for on-chip RLC interconnects. Timing Issues in the Specification and Synthesis of Digital Systems 2002: 63-69 - [c1]Kanak Agarwal, Yu Cao, Takashi Sato, Dennis Sylvester, Chenming Hu:
Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysis. ASP-DAC/VLSI Design 2002: 77-
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-10-07 22:24 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
