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"Parametric Yield Analysis and Optimization in Leakage Dominated Technologies."

Kanak Agarwal et al. (2007)

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DOI: 10.1109/TVLSI.2007.898625

access: closed

type: Journal Article

metadata version: 2024-06-04

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Kanak Agarwal, Rahul M. Rao, Dennis Sylvester, Richard B. Brown:
Parametric Yield Analysis and Optimization in Leakage Dominated Technologies. IEEE Trans. Very Large Scale Integr. Syst. 15(6): 613-623 (2007)

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