"Characterizing within-die and die-to-die delay variations introduced by ..."

Jim Aarestad et al. (2011)

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DOI: 10.1145/2024724.2024848

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-04

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  - conf/dac/AarestadLPAA11
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Jim Aarestad, Charles Lamech, Jim Plusquellic, Dhruva Acharyya, Kanak Agarwal:
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect. DAC 2011: 534-539

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