"REBEL and TDC: Two embedded test structures for on-chip measurements of ..."

Charles Lamech et al. (2011)

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DOI: 10.1109/ICCAD.2011.6105322

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-04

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Charles Lamech, Jim Aarestad, Jim Plusquellic, Reza M. Rad, Kanak Agarwal:
REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations. ICCAD 2011: 170-177

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