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"Characterizing within-die variation from multiple supply port IDDQ ..."

Kanak Agarwal, Dhruva Acharyya, Jim Plusquellic (2009)

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DOI: 10.1145/1687399.1687479

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-04

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  dblp key:
  - conf/iccad/AgarwalAP09
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  - https://dblp.org/rec/conf/iccad/AgarwalAP09
Kanak Agarwal, Dhruva Acharyya, Jim Plusquellic:
Characterizing within-die variation from multiple supply port IDDQ measurements. ICCAD 2009: 418-424

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