"Characterizing within-die variation from multiple supply port IDDQ ..."

Kanak Agarwal, Dhruva Acharyya, Jim Plusquellic (2009)

> Home

Details and statistics

DOI: 10.1145/1687399.1687479

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-04

- view
  authority control:
- export record
  dblp key:
  - conf/iccad/AgarwalAP09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccad/AgarwalAP09
Kanak Agarwal, Dhruva Acharyya, Jim Plusquellic:
Characterizing within-die variation from multiple supply port IDDQ measurements. ICCAD 2009: 418-424

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.