"Active learning framework for post-silicon variation extraction and test ..."

Cheng Zhuo et al. (2010)

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DOI: 10.1109/ICCAD.2010.5653806

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-04

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Cheng Zhuo, Kanak Agarwal, David T. Blaauw, Dennis Sylvester:
Active learning framework for post-silicon variation extraction and test cost reduction. ICCAD 2010: 508-515

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