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"Measuring within-die spatial variation profile through power supply ..."

Jim Plusquellic, Dhruva Acharyya, Kanak Agarwal (2011)

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DOI: 10.1109/ISQED.2011.5770807

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-04

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  - conf/isqed/PlusquellicAA11
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Jim Plusquellic, Dhruva Acharyya, Kanak Agarwal:
Measuring within-die spatial variation profile through power supply current measurements. ISQED 2011: 711-715

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