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ORCIDMichael G. Pecht
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- affiliation: University of Maryland, Center for Advanced Life Cycle Engineering (CALCE)
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2020 – today
- 2025
[j202]Devon R. Richman
, Michael H. Azarian, Diganta Das, Michael G. Pecht:
Analysis of Standards-Based Counterfeit Microelectronics Detection Methods. IEEE Access 13: 7691-7704 (2025)- 2024
- [j201]Quanqing Yu, Rui Xiong, Chuan Li, Michael G. Pecht:
Corrections to "Water-Resistant Smartphone Technologies". IEEE Access 12: 42316 (2024) - [j200]Varun Khemani, Michael H. Azarian, Michael G. Pecht:
WavePHMNet: A comprehensive diagnosis and prognosis approach for analog circuits. Adv. Eng. Informatics 59: 102323 (2024) - [j199]Yu Sun, Lei Su, Jiefei Gu, Xinwei Zhao, Ke Li, Michael G. Pecht:
Flip-chip solder bumps defect detection using a self-search lightweight framework. Adv. Eng. Informatics 60: 102395 (2024) - [j198]Chuanjiang Li, Shaobo Li, Yixiong Feng, Konstantinos Gryllias, Fengshou Gu, Michael G. Pecht:
Small data challenges for intelligent prognostics and health management: a review. Artif. Intell. Rev. 57(8): 214 (2024) - [j197]Siyu Zhang, Lei Su, Jiefei Gu, Ke Li, Weitian Wu, Michael G. Pecht:
Category-level selective dual-adversarial network using significance-augmented unsupervised domain adaptation for surface defect detection. Expert Syst. Appl. 238(Part B): 121879 (2024) - [j196]Yu Sun, Lei Su, Jiefei Gu, Xinwei Zhao, Ke Li, Michael G. Pecht:
Search for a Dual-Convergence Sparse Feature Extractor With Visualization Vibration Signals Architecture Feature for Flip-Chip Defect Detection. IEEE Trans. Ind. Informatics 20(8): 10134-10144 (2024) - 2023
- [j195]Syed Mujahid Abbas, Qiang Yu, Michael G. Pecht:
Influence of Substrate on Microvia Structures in Printed Circuit Boards During Reflow. IEEE Access 11: 142487-142494 (2023) - [j194]Mohamed Arezki Mellal, Enrico Zio, Michael G. Pecht:
Multi-objective reliability and cost optimization of fuel cell vehicle system with fuzzy feasibility. Inf. Sci. 640: 119112 (2023) - [j193]Hao Lyu, Hongchen Qu, Zaiyou Yang, Li Ma, Bing Lu, Michael G. Pecht:
Reliability analysis of dependent competing failure processes with time-varying δ shock model. Reliab. Eng. Syst. Saf. 229: 108876 (2023) - [j192]Hao Lyu, Hongchen Qu, Hualong Xie, Yimin Zhang, Michael G. Pecht:
Reliability analysis of the multi-state system with nonlinear degradation model under Markov environment. Reliab. Eng. Syst. Saf. 238: 109411 (2023) - [j191]Yu Sun, Lei Su, Jiefei Gu, Ke Li, Michael G. Pecht:
A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection. IEEE Trans. Instrum. Meas. 72: 1-10 (2023) - 2022
- [j190]Shehla Amir, Moneeba Gulzar, Muhammad Osama Tarar, Ijaz Haider Naqvi, Nauman Ahmad Zaffar, Michael G. Pecht:
Dynamic Equivalent Circuit Model to Estimate State-of-Health of Lithium-Ion Batteries. IEEE Access 10: 18279-18288 (2022) - [j189]Harsha Walvekar, Hector Beltran, Shashank Sripad, Michael G. Pecht:
Implications of the Electric Vehicle Manufacturers' Decision to Mass Adopt Lithium-Iron Phosphate Batteries. IEEE Access 10: 63834-63843 (2022) - [j188]Zhenyu Wu, Hongkui Zhang, Juchuan Guo, Yang Ji, Michael G. Pecht:
Imbalanced bearing fault diagnosis under variant working conditions using cost-sensitive deep domain adaptation network. Expert Syst. Appl. 193: 116459 (2022) - [j187]Chuanjiang Li, Shaobo Li, Ansi Zhang, Lei Yang, Enrico Zio, Michael G. Pecht, Konstantinos Gryllias:
A Siamese hybrid neural network framework for few-shot fault diagnosis of fixed-wing unmanned aerial vehicles. J. Comput. Des. Eng. 9(4): 1511-1524 (2022) - [j186]Xiaosong Hu, Xinchen Deng, Feng Wang, Zhongwei Deng, Xianke Lin, Remus Teodorescu, Michael G. Pecht:
A Review of Second-Life Lithium-Ion Batteries for Stationary Energy Storage Applications. Proc. IEEE 110(6): 735-753 (2022) - [j185]Hao Lyu, Shuai Wang, Li Ma, Xiaowen Zhang, Michael G. Pecht:
Reliability modeling for planetary gear transmission system considering dependent failure processes. Qual. Reliab. Eng. Int. 38(1): 229-247 (2022) - [j184]Yinghong Zhao, Xiao He, Donghua Zhou, Michael G. Pecht:
Detection and Isolation of Wheelset Intermittent Over-Creeps for Electric Multiple Units Based on a Weighted Moving Average Technique. IEEE Trans. Intell. Transp. Syst. 23(4): 3392-3405 (2022) - 2021
- [j183]Aishwarya Gaonkar, Rajkumar B. Patil, San Kyeong, Diganta Das, Michael G. Pecht:
An Assessment of Validity of the Bathtub Model Hazard Rate Trends in Electronics. IEEE Access 9: 10282-10290 (2021) - [j182]Darius Roman, Saurabh Saxena, Jens Bruns, Valentin Robu, Michael G. Pecht, David Flynn:
A Machine Learning Degradation Model for Electrochemical Capacitors Operated at High Temperature. IEEE Access 9: 25544-25553 (2021) - [j181]Hao Lyu, Xiaowen Zhang, Zaiyou Yang, Shuai Wang, Changyou Li, Michael G. Pecht:
Reliability Analysis for the Dependent Competing Failure With Wear Model and its Application to the Turbine and Worm System. IEEE Access 9: 50265-50280 (2021) - [j180]Bin Xu, Lingxi Kong, Guangrui Wen, Michael G. Pecht:
Protection Devices in Commercial 18650 Lithium-Ion Batteries. IEEE Access 9: 66687-66695 (2021) - [j179]Ryan Aalund, Weiping Diao, Lingxi Kong, Michael G. Pecht:
Understanding the Non-Collision Related Battery Safety Risks in Electric Vehicles a Case Study in Electric Vehicle Recalls and the LG Chem Battery. IEEE Access 9: 89527-89532 (2021) - [j178]Xiangxiang Liu, Tianlei Jiao, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht:
Nonparametric Model-Based Online Junction Temperature and State-of-Health Estimation for Insulated Gate Bipolar Transistors. IEEE Access 9: 95304-95316 (2021) - [j177]Bin Zhang, Tao Liu, Bin Zhang, Michael G. Pecht:
Recent Development of Unpowered Exoskeletons for Lower Extremity: A Survey. IEEE Access 9: 138042-138056 (2021) - [j176]Dylan A. Hazelwood, Michael G. Pecht:
Life Extension of Electronic Products: A Case Study of Smartphones. IEEE Access 9: 144726-144739 (2021) - [j175]Yinghong Zhao, Xiao He, Junfeng Zhang, Hongquan Ji, Donghua Zhou, Michael G. Pecht:
Detection of intermittent faults based on an optimally weighted moving average T2 control chart with stationary observations. Autom. 123: 109298 (2021) - [j174]Darius Roman, Saurabh Saxena, Valentin Robu, Michael G. Pecht, David Flynn:
Machine learning pipeline for battery state-of-health estimation. Nat. Mach. Intell. 3(5): 447-456 (2021) - [j173]Hao Lyu, Zaiyou Yang, Shuai Wang, Yaping Zhao, Michael G. Pecht:
Reliability modeling for multistage systems subject to competing failure processes. Qual. Reliab. Eng. Int. 37(6): 2936-2949 (2021) - [j172]Yu Zang, Wei ShangGuan, Baigen Cai, Huashen Wang, Michael G. Pecht:
Hybrid remaining useful life prediction method. A case study on railway D-cables. Reliab. Eng. Syst. Saf. 213: 107746 (2021) - [j171]Minghang Zhao, Shisheng Zhong, Xuyun Fu, Baoping Tang, Shaojiang Dong, Michael G. Pecht:
Deep Residual Networks With Adaptively Parametric Rectifier Linear Units for Fault Diagnosis. IEEE Trans. Ind. Electron. 68(3): 2587-2597 (2021) - [j170]Changyong Lee, Sugyeong Jo, Daeil Kwon, Michael G. Pecht:
Capacity-Fading Behavior Analysis for Early Detection of Unhealthy Li-Ion Batteries. IEEE Trans. Ind. Electron. 68(3): 2659-2666 (2021) - [j169]Zhen Jia, Zhenbao Liu, Yanfen Gan, Chi-Man Vong, Michael G. Pecht:
A Deep Forest-Based Fault Diagnosis Scheme for Electronics-Rich Analog Circuit Systems. IEEE Trans. Ind. Electron. 68(10): 10087-10096 (2021) - [j168]Lei Su, Xiaonan Yu, Ke Li, Jiefei Gu, Michael G. Pecht:
Sparse Reconstruction for Microdefect Detection of Two-Dimensional Ultrasound Image Based on Blind Estimation. IEEE Trans. Ind. Electron. 68(10): 10154-10161 (2021) - [j167]Chun Cheng, Yan Hu, Jinrui Wang, Haining Liu, Michael G. Pecht:
Generalized sparse filtering for rotating machinery fault diagnosis. J. Supercomput. 77(4): 3402-3421 (2021) - [i4]Darius Roman, Saurabh Saxena, Valentin Robu, Michael G. Pecht, David Flynn:
Machine learning pipeline for battery state of health estimation. CoRR abs/2102.00837 (2021) - 2020
- [j166]Shuwen Chen, Hongjuan Ge, Jing Li, Michael G. Pecht:
Correction to "Progressive Improved Convolutional Neural Network for Avionics Fault Diagnosis". IEEE Access 8: 20012 (2020) - [j165]Weiping Diao, Saurabh Saxena, Michael G. Pecht:
Analysis of Specified Capacity in Power Banks. IEEE Access 8: 21326-21332 (2020) - [j164]Xiangxiang Liu, Lingling Li, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht:
Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor. IEEE Access 8: 69471-69481 (2020) - [j163]Hayder Ali, Hassan Abbas Khan, Michael G. Pecht:
Evaluation of Li-Based Battery Current, Voltage, and Temperature Profiles for In-Service Mobile Phones. IEEE Access 8: 73665-73676 (2020) - [j162]Hamidreza Habibollahi Najaf Abadi, Michael G. Pecht:
Artificial Intelligence Trends Based on the Patents Granted by the United States Patent and Trademark Office. IEEE Access 8: 81633-81643 (2020) - [j161]Lu Zhang, Hongjuan Ge, Ying Ma, Jianliang Xue, Huang Li, Michael G. Pecht:
Multi-Objective Optimization Design of a Notch Filter Based on Improved NSGA-II for Conducted Emissions. IEEE Access 8: 83213-83223 (2020) - [j160]Xingyan Yao, Lingxi Kong, Michael G. Pecht:
Reliability of Cylindrical Li-ion Battery Safety Vents. IEEE Access 8: 101859-101866 (2020) - [j159]Chien-Ming Huang, Anto Raj, Michael D. Osterman, Michael G. Pecht:
Assembly Options and Challenges for Electronic Products With Lead-Free Exemption. IEEE Access 8: 134194-134208 (2020) - [j158]Wei ShangGuan, Yu Zang, Huashen Wang, Michael G. Pecht:
Board-Level Lifetime Prediction for Power Board of Balise Transmission Module in High-Speed Railways. IEEE Access 8: 135011-135024 (2020) - [j157]Hamidreza Habibollahi Najaf Abadi, Zhou He, Michael G. Pecht:
Artificial Intelligence-Related Research Funding by the U.S. National Science Foundation and the National Natural Science Foundation of China. IEEE Access 8: 183448-183459 (2020) - [j156]Seong-Woo Woo, Michael G. Pecht, Dennis L. O'Neal:
Reliability design and case study of the domestic compressor subjected to repetitive internal stresses. Reliab. Eng. Syst. Saf. 193: 106604 (2020) - [j155]Kai Wang, Haifeng Guo, Aidong Xu, Michael G. Pecht:
Degradation Monitoring of Insulation Systems Used in Low-Voltage Electromagnetic Coils under Thermal Loading Conditions from a Creep Point of View. Sensors 20(13): 3696 (2020) - [j154]Wenliao Du, Myeongsu Kang, Michael G. Pecht:
Fault Diagnosis Using Adaptive Multifractal Detrended Fluctuation Analysis. IEEE Trans. Ind. Electron. 67(3): 2272-2282 (2020) - [j153]Minghang Zhao, Shisheng Zhong, Xuyun Fu, Baoping Tang, Michael G. Pecht:
Deep Residual Shrinkage Networks for Fault Diagnosis. IEEE Trans. Ind. Informatics 16(7): 4681-4690 (2020) - [j152]Zhenyu Wu, Wenfang Lin, Binghao Fu, Juchuan Guo, Yang Ji, Michael G. Pecht:
A Local Adaptive Minority Selection and Oversampling Method for Class-Imbalanced Fault Diagnostics in Industrial Systems. IEEE Trans. Reliab. 69(4): 1195-1206 (2020) - [c34]Arjun Kumar, Mohammad Ashraful Hoque, Petteri Nurmi, Michael G. Pecht, Sasu Tarkoma, Junehwa Song:
Battery Health Estimation for IoT Devices using V-Edge Dynamics. HotMobile 2020: 56-61 - [i3]Namkyoung Lee, Michael H. Azarian, Michael G. Pecht:
An Explainable Deep Learning-based Prognostic Model for Rotating Machinery. CoRR abs/2004.13608 (2020) - [i2]Yinghong Zhao, Xiao He, Michael G. Pecht, Junfeng Zhang, Donghua Zhou:
Detection and Detectability of Intermittent Faults Based on Moving Average T2 Control Charts with Multiple Window Lengths. CoRR abs/2005.06825 (2020) - [i1]Yinghong Zhao, Xiao He, Junfeng Zhang, Hongquan Ji, Donghua Zhou, Michael G. Pecht:
Detection of Intermittent Faults Based on an Optimally Weighted Moving Average T^2 Control Chart with Stationary Gaussian Observations. CoRR abs/2005.06832 (2020)
2010 – 2019
- 2019
- [j151]Lei Su, Xiaonan Yu, Ke Li, Xingyan Yao, Michael G. Pecht:
Simulation and Experimental Verification of Edge Blurring Phenomenon in Microdefect Inspection Based on High-Frequency Ultrasound. IEEE Access 7: 11515-11525 (2019) - [j150]Zhen Jia, Zhenbao Liu, Chi-Man Vong, Michael G. Pecht:
A Rotating Machinery Fault Diagnosis Method Based on Feature Learning of Thermal Images. IEEE Access 7: 12348-12359 (2019) - [j149]Xingyan Yao, Michael G. Pecht:
Tab Design and Failures in Cylindrical Li-ion Batteries. IEEE Access 7: 24082-24095 (2019) - [j148]Quanqing Yu, Rui Xiong, Chuan Li, Michael G. Pecht:
Water-Resistant Smartphone Technologies. IEEE Access 7: 42757-42773 (2019) - [j147]Xingyan Yao, Saurabh Saxena, Lei Su, Michael G. Pecht:
The Explosive Nature of Tab Burrs in Li-Ion Batteries. IEEE Access 7: 45978-45982 (2019) - [j146]Lidia Al-Zogbi, Diganta Das, Peter Rundle, Michael G. Pecht:
Breaking the Trust: How Companies Are Failing Their Customers. IEEE Access 7: 52522-52531 (2019) - [j145]Fateme Dinmohammadi, David Flynn, Chris Bailey, Michael G. Pecht, Chunyan Yin, Pushparajah Rajaguru, Valentin Robu:
Predicting Damage and Life Expectancy of Subsea Power Cables in Offshore Renewable Energy Applications. IEEE Access 7: 54658-54669 (2019) - [j144]Yan Su, Xue Rui Liang, Hui Wang, Jin Jun Wang, Michael G. Pecht:
A Maintenance and Troubleshooting Method Based on Integrated Information and System Principles. IEEE Access 7: 70513-70524 (2019) - [j143]Yongquan Sun, Lingxi Kong, Hassan Abbas Khan, Michael G. Pecht:
Li-ion Battery Reliability - A Case Study of the Apple iPhone®. IEEE Access 7: 71131-71141 (2019) - [j142]Haining Liu, Yixiang Wang, Fajia Li, Xiaohong Wang, Chengliang Liu, Michael G. Pecht:
Perceptual Vibration Hashing by Sub-Band Coding: An Edge Computing Method for Condition Monitoring. IEEE Access 7: 129644-129658 (2019) - [j141]Zhenyu Wu, Shuyang Yu, Xinning Zhu, Yang Ji, Michael G. Pecht:
A Weighted Deep Domain Adaptation Method for Industrial Fault Prognostics According to Prior Distribution of Complex Working Conditions. IEEE Access 7: 139802-139814 (2019) - [j140]Ryan Aalund, Michael G. Pecht:
The Use of UL 1642 Impact Testing for Li-ion Pouch Cells. IEEE Access 7: 176706-176711 (2019) - [j139]Shuwen Chen, Hongjuan Ge, Jing Li, Michael G. Pecht:
Progressive Improved Convolutional Neural Network for Avionics Fault Diagnosis. IEEE Access 7: 177362-177375 (2019) - [j138]Guanghua Wu, Meixian Jiang, Diganta Das, Michael G. Pecht:
ACA Curing Process Optimization Based on Curing Degree Considering Shear Strength of Joints. IEEE Access 7: 182906-182915 (2019) - [j137]Jingying Zhao, Yongqi Xing, Zhengliang Sun, Michael G. Pecht:
Transmission characteristics analysis of an MCR-WPT system with SP resonance structure based on harmonic current influence. IEICE Electron. Express 16(17): 20190460 (2019) - [j136]Yongzhi Zhang, Rui Xiong, Hongwen He, Michael G. Pecht:
Lithium-Ion Battery Remaining Useful Life Prediction With Box-Cox Transformation and Monte Carlo Simulation. IEEE Trans. Ind. Electron. 66(2): 1585-1597 (2019) - [j135]Minghang Zhao, Myeongsu Kang, Baoping Tang, Michael G. Pecht:
Multiple Wavelet Coefficients Fusion in Deep Residual Networks for Fault Diagnosis. IEEE Trans. Ind. Electron. 66(6): 4696-4706 (2019) - [j134]Jinwoo Lee, Daeil Kwon, Michael G. Pecht:
Reduction of Li-ion Battery Qualification Time Based on Prognostics and Health Management. IEEE Trans. Ind. Electron. 66(9): 7310-7315 (2019) - [j133]Rui Xiong, Yongzhi Zhang, Ju Wang, Hongwen He, Simin Peng, Michael G. Pecht:
Lithium-Ion Battery Health Prognosis Based on a Real Battery Management System Used in Electric Vehicles. IEEE Trans. Veh. Technol. 68(5): 4110-4121 (2019) - [c33]Saikath Bhattacharya, Lance Fiondella, Saurabh Saxena, Michael G. Pecht:
Quantifying the Impact of Prognostic Distance on Average Cost per Cycle. ICPHM 2019: 1-7 - [c32]Varun Khemani, Michael H. Azarian, Michael G. Pecht:
Electronic Circuit Diagnosis with No Data. ICPHM 2019: 1-7 - [c31]Namkyoung Lee, Michael H. Azarian, Michael G. Pecht, Jinyong Kim, Jongsoon Im:
A Comparative Study of Deep Learning-Based Diagnostics for Automotive Safety Components Using a Raspberry Pi. ICPHM 2019: 1-7 - [c30]Yan Su, Xue Rui Liang, Chenxuan Gu, Varun Khemani, Michael G. Pecht:
A Multivalued Test and Diagnostic Strategy Optimization Method for Aircraft System Fault Diagnosis. ICPHM 2019: 1-6 - [c29]Pandav Kiran Maroti, Sanjeevikumar Padmanaban, Jens Bo Holm-Nielsen, Michael G. Pecht, Olouremfemi Ojo:
A Novel Configurations of Modified CUK Converter Using Multiple VLSI Modules for High Voltage Renewable Energy Application. IECON 2019: 4083-4088 - [c28]Diganta Das, Edmond Elburn, Michael G. Pecht, Bhanu Sood:
Evaluating Impact of Information Uncertainties on Component Reliability Assessment. IRPS 2019: 1-9 - 2018
- [j132]Mehdi Kohani, Michael G. Pecht:
Malfunctions of Medical Devices Due to Electrostatic Occurrences Big Data Analysis of 10 Years of the FDA's Reports. IEEE Access 6: 5805-5811 (2018) - [j131]Michael G. Pecht, Irfan Ali, Augustus Carlson:
Phthalates in Electronics: The Risks and the Alternatives. IEEE Access 6: 6232-6242 (2018) - [j130]Lingxi Kong, Yinjiao Xing, Michael G. Pecht:
In-Situ Observations of Lithium Dendrite Growth. IEEE Access 6: 8387-8393 (2018) - [j129]Payam Motabar, Helmuth E. Gonzalez, Peter Rundle, Michael G. Pecht:
How Poor Reliability Affects Warranties: An Analysis of General Motors' Powertrain Warranty Reduction. IEEE Access 6: 15065-15074 (2018) - [j128]Zhenbao Liu, Zhen Jia, Chi-Man Vong, Junwei Han, Chenggang Yan, Michael G. Pecht:
A Patent Analysis of Prognostics and Health Management (PHM) Innovations for Electrical Systems. IEEE Access 6: 18088-18107 (2018) - [j127]Saurabh Saxena, Lingxi Kong, Michael G. Pecht:
Exploding E-Cigarettes: A Battery Safety Issue. IEEE Access 6: 21442-21466 (2018) - [j126]Yongquan Sun, Tieyuan Sun, Michael G. Pecht, Chunyu Yu:
Computing Lifetime Distributions and Reliability for Systems With Outsourced Components: A Case Study. IEEE Access 6: 31359-31366 (2018) - [j125]Xuerong Ye, Cen Chen, Myeongsu Kang, Guofu Zhai, Michael G. Pecht:
A Joint Distribution-Based Testability Metric Estimation Model for Unreliable Tests. IEEE Access 6: 42566-42577 (2018) - [j124]Jie Gao, Myeongsu Kang, Jing Tian, Lifeng Wu, Michael G. Pecht:
Unsupervised Locality-Preserving Robust Latent Low-Rank Recovery-Based Subspace Clustering for Fault Diagnosis. IEEE Access 6: 52345-52354 (2018) - [j123]Xuejiao Du, Zhaojun Yang, Chuanhai Chen, Xiaoxu Li, Michael G. Pecht:
Reliability Analysis of Repairable Systems Based on a Two-Segment Bathtub-Shaped Failure Intensity Function. IEEE Access 6: 52374-52384 (2018) - [j122]Kai Wang, Haifeng Guo, Aidong Xu, N. Jordan Jameson, Michael G. Pecht, Bingjun Yan:
Creating Self-Aware Low-Voltage Electromagnetic Coils for Incipient Insulation Degradation Monitoring for Smart Manufacturing. IEEE Access 6: 69860-69868 (2018) - [j121]Michael G. Pecht:
An Editorial From the Editor-in-Chief of the IEEE ACCESS, at the End of his Six Year Term. IEEE Access 6: 72046 (2018) - [j120]Jingying Zhao, Zhengliang Sun, Michael G. Pecht, Sinuo Zhou:
Analysis and experiments on transmission characteristics of LCCL mobile wireless power transfer system. IEICE Electron. Express 15(23): 20180964 (2018) - [j119]Chien-Ming Huang, Daniel Nunez, James Coburn, Michael G. Pecht:
Risk of tin whiskers in the nuclear industry. Microelectron. Reliab. 81: 22-30 (2018) - [j118]Subramani Manoharan, Chandradip Patel, F. Patrick McCluskey, Michael G. Pecht:
Effective decapsulation of copper wire-bonded microelectronic devices for reliability assessment. Microelectron. Reliab. 84: 197-207 (2018) - [j117]Yongquan Sun, Xueling Hao, Michael G. Pecht, Yapeng Zhou:
Remaining useful life prediction for lithium-ion batteries based on an integrated health indicator. Microelectron. Reliab. 88-90: 1189-1194 (2018) - [j116]Lei Shu, Mithun Mukherjee, Michael G. Pecht, Noël Crespi, Son N. Han:
Challenges and Research Issues of Data Management in IoT for Large-Scale Petrochemical Plants. IEEE Syst. J. 12(3): 2509-2523 (2018) - [j115]Rui Xiong, Yongzhi Zhang, Hongwen He, Xuan Zhou, Michael G. Pecht:
A Double-Scale, Particle-Filtering, Energy State Prediction Algorithm for Lithium-Ion Batteries. IEEE Trans. Ind. Electron. 65(2): 1526-1538 (2018) - [j114]Arvind Sai Sarathi Vasan, Michael G. Pecht:
Electronic Circuit Health Estimation Through Kernel Learning. IEEE Trans. Ind. Electron. 65(2): 1585-1594 (2018) - [j113]Minghang Zhao, Myeongsu Kang, Baoping Tang, Michael G. Pecht:
Deep Residual Networks With Dynamically Weighted Wavelet Coefficients for Fault Diagnosis of Planetary Gearboxes. IEEE Trans. Ind. Electron. 65(5): 4290-4300 (2018) - [j112]Fardin Dalvand, Myeongsu Kang, Satar Dalvand, Michael G. Pecht:
Detection of Generalized-Roughness and Single-Point Bearing Faults Using Linear Prediction-Based Current Noise Cancellation. IEEE Trans. Ind. Electron. 65(12): 9728-9738 (2018) - [j111]Yongzhi Zhang, Rui Xiong, Hongwen He, Michael G. Pecht:
Long Short-Term Memory Recurrent Neural Network for Remaining Useful Life Prediction of Lithium-Ion Batteries. IEEE Trans. Veh. Technol. 67(7): 5695-5705 (2018) - [c27]Wenliao Du, Sugai Han, Xiaowei Song, Shuxia Tian, Michael G. Pecht:
Condition Monitoring Model of a Hydraulic System in Truck Crane. ICPHM 2018: 1-5 - [c26]Saurabh Saxena, Myeongsu Kang, Yinjiao Xing, Michael G. Pecht:
Anomaly Detection During Lithium-ion Battery Qualification Testing. ICPHM 2018: 1-6 - [c25]Yapeng Zhou, Miaohua Huang, Michael G. Pecht:
An Online State of Health Estimation Method for Lithium-ion Batteries Based on Integrated Voltage. ICPHM 2018: 1-5 - [c24]Lucas Kirschbaum, Fateme Dinmohammadi, David Flynn, Valentin Robu, Michael G. Pecht:
Failure Analysis Informing Embedded Health Monitoring of Electromagnetic Relays. ICSRS 2018: 261-267 - 2017
- [j110]Tyler J. Formica, Hassan Abbas Khan, Michael G. Pecht:
The Effect of Inverter Failures on the Return on Investment of Solar Photovoltaic Systems. IEEE Access 5: 21336-21343 (2017) - [j109]Karthikeyan Venkitusamy, Sanjeevikumar Padmanaban, Michael G. Pecht, Abhishek Awasthi, Rajasekar Selvamuthukumaran:
A modified boost rectifier for elimination of circulating current in power factor correction applications. Microelectron. Reliab. 69: 29-35 (2017) - [j108]Aleksandra Fortier, Michael G. Pecht:
A perspective of the IPC report on lead-free electronics in military/aerospace applications. Microelectron. Reliab. 69: 66-70 (2017) - [j107]Xiaohong Su, Shuai Wang, Michael G. Pecht, Lingling Zhao, Zhe Ye:
Interacting multiple model particle filter for prognostics of lithium-ion batteries. Microelectron. Reliab. 70: 59-69 (2017) - [j106]Shunfeng Cheng, Chien-Ming Huang, Michael G. Pecht:
A review of lead-free solders for electronics applications. Microelectron. Reliab. 75: 77-95 (2017) - [j105]Ben Cornelius, Shay Treivish, Yair Rosenthal, Michael G. Pecht:
The phenomenon of tin pest: A review. Microelectron. Reliab. 79: 175-192 (2017) - [j104]Zhenbao Liu, Taimin Liu, Junwei Han, Shuhui Bu, Xiaojun Tang, Michael G. Pecht:
Signal Model-Based Fault Coding for Diagnostics and Prognostics of Analog Electronic Circuits. IEEE Trans. Ind. Electron. 64(1): 605-614 (2017) - [j103]N. Jordan Jameson, Michael H. Azarian, Michael G. Pecht:
Impedance-Based Condition Monitoring for Insulation Systems Used in Low-Voltage Electromagnetic Coils. IEEE Trans. Ind. Electron. 64(5): 3748-3757 (2017) - [j102]Moon-Hwan Chang, Myeongsu Kang, Michael G. Pecht:
Prognostics-Based LED Qualification Using Similarity-Based Statistical Measure With RVM Regression Model. IEEE Trans. Ind. Electron. 64(7): 5667-5677 (2017) - [j101]Fardin Dalvand, Satar Dalvand, Fatemeh Sharafi, Michael G. Pecht:
Current Noise Cancellation for Bearing Fault Diagnosis Using Time Shifting. IEEE Trans. Ind. Electron. 64(10): 8138-8147 (2017) - [j100]Zhenbao Liu, Gaoyuan Sun, Shuhui Bu, Junwei Han, Xiaojun Tang, Michael G. Pecht:
Particle Learning Framework for Estimating the Remaining Useful Life of Lithium-Ion Batteries. IEEE Trans. Instrum. Meas. 66(2): 280-293 (2017) - [j99]Zhengxin Zhang, Xiao-Sheng Si, Chang-Hua Hu, Michael G. Pecht:
A Prognostic Model for Stochastic Degrading Systems With State Recovery: Application to Li-Ion Batteries. IEEE Trans. Reliab. 66(4): 1293-1308 (2017) - 2016
- [j98]Daeil Kwon, Melinda R. Hodkiewicz, Jiajie Fan, Tadahiro Shibutani, Michael G. Pecht:
IoT-Based Prognostics and Systems Health Management for Industrial Applications. IEEE Access 4: 3659-3670 (2016) - [j97]Mehdi Kohani, Michael G. Pecht:
New Minimum Relative Humidity Requirements Are Expected to Lead to More Medical Device Failures. J. Medical Syst. 40(3): 58:1-58:6 (2016) - [j96]Mehdi Kohani, Michael G. Pecht:
Erratum to: New Minimum Relative Humidity Requirements Are Expected to Lead to More Medical Device Failures. J. Medical Syst. 40(4): 86:1-86:2 (2016) - [j95]Yi Wan, Hailong Huang, Diganta Das, Michael G. Pecht:
Thermal reliability prediction and analysis for high-density electronic systems based on the Markov process. Microelectron. Reliab. 56: 182-188 (2016) - [j94]Ee-Hua Wong, W. D. van Driel, Abhijit Dasgupta, Michael G. Pecht:
Creep fatigue models of solder joints: A critical review. Microelectron. Reliab. 59: 1-12 (2016) - [j93]Michael G. Pecht, Tadahiro Shibutani, Lifeng Wu:
A reliability assessment guide for the transition planning to lead-free electronics for companies whose products are RoHS exempted or excluded. Microelectron. Reliab. 62: 113-123 (2016) - [j92]Michael G. Pecht, Tadahiro Shibutani, Myeongsu Kang, Melinda Hodkiewicz, Edward Cripps:
A fusion prognostics-based qualification test methodology for microelectronic products. Microelectron. Reliab. 63: 320-324 (2016) - [j91]Elviz George, Michael G. Pecht:
RoHS compliance in safety and reliability critical electronics. Microelectron. Reliab. 65: 1-7 (2016) - [j90]N. Jordan Jameson, Xin Song, Michael G. Pecht:
Conflict Minerals in Electronic Systems: An Overview and Critique of Legal Initiatives. Sci. Eng. Ethics 22(5): 1375-1389 (2016) - [j89]Jing Tian, Carlos Morillo, Michael H. Azarian, Michael G. Pecht:
Motor Bearing Fault Detection Using Spectral Kurtosis-Based Feature Extraction Coupled With K-Nearest Neighbor Distance Analysis. IEEE Trans. Ind. Electron. 63(3): 1793-1803 (2016) - [j88]Myeongsu Kang, Md. Rashedul Islam, Jaeyoung Kim, Jong-Myon Kim, Michael G. Pecht:
A Hybrid Feature Selection Scheme for Reducing Diagnostic Performance Deterioration Caused by Outliers in Data-Driven Diagnostics. IEEE Trans. Ind. Electron. 63(5): 3299-3310 (2016) - [j87]Myeongsu Kang, Jaeyoung Kim, In-Kyu Jeong, Jong-Myon Kim, Michael G. Pecht:
A Massively Parallel Approach to Real-Time Bearing Fault Detection Using Sub-Band Analysis on an FPGA-Based Multicore System. IEEE Trans. Ind. Electron. 63(10): 6325-6335 (2016) - [j86]Lei Shu, Carlo Cecati, Michael G. Pecht, Vincenzo Loia, Noël Crespi:
Guest Editorial Industrial Sensing Intelligence. IEEE Trans. Ind. Informatics 12(6): 2086-2090 (2016) - [c23]Myeongsu Kang, Gopala Krishnan Ramaswami, Melinda Hodkiewicz, Edward Cripps, Jong-Myon Kim, Michael G. Pecht:
A Sequential k-Nearest Neighbor Classification Approach for Data-Driven Fault Diagnosis Using Distance- and Density-Based Affinity Measures. DMBD 2016: 253-261 - [c22]N. Jordan Jameson, Michael H. Azarian, Michael G. Pecht:
Correlation analysis for impedance-based health monitoring of electromagnetic coils. ICPHM 2016: 1-6 - 2015
- [j85]Jiajie Fan, Kam-Chuen Yung, Michael G. Pecht:
Predicting long-term lumen maintenance life of LED light sources using a particle filter-based prognostic approach. Expert Syst. Appl. 42(5): 2411-2420 (2015) - [j84]Wenjin Zhang, Shunli Liu, Bo Sun, Yue Liu, Michael G. Pecht:
A cloud model-based method for the analysis of accelerated life test data. Microelectron. Reliab. 55(1): 123-128 (2015) - [j83]Moon-Hwan Chang, Peter Sandborn, Michael G. Pecht, Winco K. C. Yung, Wenbin Wang:
A return on investment analysis of applying health monitoring to LED lighting systems. Microelectron. Reliab. 55(3-4): 527-537 (2015) - [j82]Elviz George, Michael D. Osterman, Michael G. Pecht:
An evaluation of dwell time and mean cyclic temperature parameters in the Engelmaier model. Microelectron. Reliab. 55(3-4): 582-587 (2015) - [j81]Nishad Patil, Diganta Das, Michael G. Pecht:
Anomaly detection for IGBTs using Mahalanobis distance. Microelectron. Reliab. 55(7): 1054-1059 (2015) - [j80]Hyun-Seok Oh, Seung-yun Choi, Keunsu Kim, Byeng D. Youn, Michael G. Pecht:
An empirical model to describe performance degradation for warranty abuse detection in portable electronics. Reliab. Eng. Syst. Saf. 142: 92-99 (2015) - [j79]Liliane L. Tessa, Bhanu P. Sood, Michael G. Pecht:
Field Reliability Estimation for Cochlear Implants. IEEE Trans. Biomed. Eng. 62(8): 2062-2069 (2015) - [c21]Jiajie Fan, Wei He, Christopher Hendricks, Michael G. Pecht, Kam-Chuen Yung:
A practical design of reliability and performance test for portable lithium-ion batteries. ICIA 2015: 142-147 - [c20]Peijun Ma, Shuai Wang, Lingling Zhao, Michael G. Pecht, Xiaohong Su, Zhe Ye:
An improved exponential model for predicting the remaining useful life of lithium-ion batteries. ICPHM 2015: 1-6 - [c19]Sony Mathew, Michael D. Osterman, Michael G. Pecht:
Considerations in implementing canary based prognostics. ICPHM 2015: 1-7 - [c18]Zhe Ye, Lingling Zhao, Zhuo Wang, Peijun Ma, Xiaohong Su, Long Pang, Michael G. Pecht:
A dual-level approach for lithium-ion battery RUL prognosis. ICPHM 2015: 1-6 - [c17]Fangdan Zheng, Jiuchun Jiang, Martha Arbayani Zaidan, Wei He, Michael G. Pecht:
Prognostics of lithium-ion batteries using a deterministic Bayesian approach. ICPHM 2015: 1-4 - 2014
- [j78]Elviz George, Michael G. Pecht:
Tin whisker analysis of an automotive engine control unit. Microelectron. Reliab. 54(1): 214-219 (2014) - [j77]Datong Liu, Yue Luo, Jie Liu, Yu Peng, Limeng Guo, Michael G. Pecht:
Lithium-ion battery remaining useful life estimation based on fusion nonlinear degradation AR model and RPF algorithm. Neural Comput. Appl. 25(3-4): 557-572 (2014) - [j76]Jiajie Fan, Kam-Chuen Yung, Michael G. Pecht:
Prognostics of lumen maintenance for High power white light emitting diodes using a nonlinear filter-based approach. Reliab. Eng. Syst. Saf. 123: 63-72 (2014) - [j75]Xiaohang Jin, Ming-Bo Zhao, Tommy W. S. Chow, Michael G. Pecht:
Motor Bearing Fault Diagnosis Using Trace Ratio Linear Discriminant Analysis. IEEE Trans. Ind. Electron. 61(5): 2441-2451 (2014) - [j74]Moon-Hwan Chang, Chaochao Chen, Diganta Das, Michael G. Pecht:
Anomaly Detection of Light-Emitting Diodes Using the Similarity-Based Metric Test. IEEE Trans. Ind. Informatics 10(3): 1852-1863 (2014) - [j73]Anshul Shrivastava, Michael H. Azarian, Carlos Morillo, Bhanu P. Sood, Michael G. Pecht:
Detection and Reliability Risks of Counterfeit Electrolytic Capacitors. IEEE Trans. Reliab. 63(2): 468-479 (2014) - [c16]Prabhakar V. Varde, Jing Tian, Michael G. Pecht:
Prognostics and health management based refurbishment for life extension of electronic systems. ICIA 2014: 1260-1267 - 2013
- [j72]B. Li, X. P. Zhang, Y. Yang, L. M. Yin, Michael G. Pecht:
Size and constraint effects on interfacial fracture behavior of microscale solder interconnects. Microelectron. Reliab. 53(1): 154-163 (2013) - [j71]Qiang Miao, Lei Xie, Hengjuan Cui, Wei Liang, Michael G. Pecht:
Remaining useful life prediction of lithium-ion battery with unscented particle filter technique. Microelectron. Reliab. 53(6): 805-810 (2013) - [j70]Yinjiao Xing, Eden W. M. Ma, Kwok-Leung Tsui, Michael G. Pecht:
An ensemble model for predicting the remaining useful performance of lithium-ion batteries. Microelectron. Reliab. 53(6): 811-820 (2013) - [j69]Datong Liu, Jingyue Pang, Jianbao Zhou, Yu Peng, Michael G. Pecht:
Prognostics for state of health estimation of lithium-ion batteries based on combination Gaussian process functional regression. Microelectron. Reliab. 53(6): 832-839 (2013) - [j68]Wei He, Nicholas Williard, Chaochao Chen, Michael G. Pecht:
State of charge estimation for electric vehicle batteries using unscented kalman filtering. Microelectron. Reliab. 53(6): 840-847 (2013) - [j67]Prasanna Tamilselvan, Pingfeng Wang, Michael G. Pecht:
A multi-attribute classification fusion system for insulated gate bipolar transistor diagnostics. Microelectron. Reliab. 53(8): 1117-1129 (2013) - [j66]Nishad Patil, Diganta Das, Estelle Scanff, Michael G. Pecht:
Long term storage reliability of antifuse field programmable gate arrays. Microelectron. Reliab. 53(12): 2052-2056 (2013) - [j65]Qiang Miao, Chao Tang, Wei Liang, Michael G. Pecht:
Health Assessment of Cooling Fan Bearings Using Wavelet-Based Filtering. Sensors 13(1): 274-291 (2013) - [j64]Arvind Sai Sarathi Vasan, Bing Long, Michael G. Pecht:
Diagnostics and Prognostics Method for Analog Electronic Circuits. IEEE Trans. Ind. Electron. 60(11): 5277-5291 (2013) - [j63]Yu Wang, Qiang Miao, Eden W. M. Ma, Kwok-Leung Tsui, Michael G. Pecht:
Online Anomaly Detection for Hard Disk Drives Based on Mahalanobis Distance. IEEE Trans. Reliab. 62(1): 136-145 (2013) - [j62]Zhi-Sheng Ye, Yu Wang, Kwok-Leung Tsui, Michael G. Pecht:
Degradation Data Analysis Using Wiener Processes With Measurement Errors. IEEE Trans. Reliab. 62(4): 772-780 (2013) - 2012
- [j61]Francesco Di Maio, J. Hu, Peter W. Tse, Michael G. Pecht, Kwok-Leung Tsui, Enrico Zio:
Ensemble-approaches for clustering health status of oil sand pumps. Expert Syst. Appl. 39(5): 4847-4859 (2012) - [j60]Shunfeng Cheng, Michael G. Pecht:
Using cross-validation for model parameter selection of sequential probability ratio test. Expert Syst. Appl. 39(9): 8467-8473 (2012) - [j59]Hyun-Seok Oh, Tadahiro Shibutani, Michael G. Pecht:
Precursor monitoring approach for reliability assessment of cooling fans. J. Intell. Manuf. 23(2): 173-178 (2012) - [j58]Sachin Kumar, Nikhil M. Vichare, Eli Dolev, Michael G. Pecht:
A health indicator method for degradation detection of electronic products. Microelectron. Reliab. 52(2): 439-445 (2012) - [j57]Nishad Patil, Diganta Das, Michael G. Pecht:
A prognostic approach for non-punch through and field stop IGBTs. Microelectron. Reliab. 52(3): 482-488 (2012) - [j56]Moon-Hwan Chang, Diganta Das, Prabhakar V. Varde, Michael G. Pecht:
Light emitting diodes reliability review. Microelectron. Reliab. 52(5): 762-782 (2012) - [j55]Michael G. Pecht:
Nvidia's GPU failures: A case for prognostics and health management. Microelectron. Reliab. 52(6): 953-957 (2012) - [j54]Wenbin Wang, Shuxin Luo, Michael G. Pecht:
Economic design of the mean prognostic distance for canary-equipped electronic systems. Microelectron. Reliab. 52(6): 1086-1091 (2012) - [j53]Xiaohang Jin, Eden W. M. Ma, L. L. Cheng, Michael G. Pecht:
Health Monitoring of Cooling Fans Based on Mahalanobis Distance With mRMR Feature Selection. IEEE Trans. Instrum. Meas. 61(8): 2222-2229 (2012) - [j52]Xiao-Sheng Si, Wenbin Wang, Chang-Hua Hu, Dong-Hua Zhou, Michael G. Pecht:
Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process. IEEE Trans. Reliab. 61(1): 50-67 (2012) - [j51]Jon G. Elerath, Michael G. Pecht:
IEEE 1413: A Standard for Reliability Predictions. IEEE Trans. Reliab. 61(1): 125-129 (2012) - [j50]Bo Sun, Shengkui Zeng, Rui Kang, Michael G. Pecht:
Benefits and Challenges of System Prognostics. IEEE Trans. Reliab. 61(2): 323-335 (2012) - [j49]Wenbin Wang, Michael G. Pecht, Yufang Liu:
Cost Optimization for Canary-Equipped Electronic Systems in Terms of Inventory Control and Maintenance Decisions. IEEE Trans. Reliab. 61(2): 466-478 (2012) - [j48]Wenbin Wang, Matthew J. Carr, Tommy W. S. Chow, Michael G. Pecht:
A Two-Level Inspection Model With Technological Insertions. IEEE Trans. Reliab. 61(2): 479-490 (2012) - [j47]Gilbert Haddad, Peter A. Sandborn, Michael G. Pecht:
An Options Approach for Decision Support of Systems With Prognostic Capabilities. IEEE Trans. Reliab. 61(4): 872-883 (2012) - 2011
- [j46]Kirk A. Gray, Michael G. Pecht:
Long-Term Thermal Overstressing of Computers. IEEE Des. Test Comput. 28(6): 58-65 (2011) - [j45]C.-H. Wu, C.-H. Yang, S.-C. Lo, Nikhil M. Vichare, E. Rhem, Michael G. Pecht:
Automatic data mining for telemetry database of computer systems. Microelectron. Reliab. 51(2): 263-269 (2011) - [j44]Gang Niu, Satnam Singh, Steven W. Holland, Michael G. Pecht:
Health monitoring of electronic products based on Mahalanobis distance and Weibull decision metrics. Microelectron. Reliab. 51(2): 279-284 (2011) - [j43]Qiang Miao, Liu Liu, Yuan Feng, Michael G. Pecht:
Complex system maintainability verification with limited samples. Microelectron. Reliab. 51(2): 294-299 (2011) - [j42]Mohammed A. Alam, Michael H. Azarian, Michael D. Osterman, Michael G. Pecht:
Temperature and voltage aging effects on electrical conduction mechanism in epoxy-BaTiO3 composite dielectric used in embedded capacitors. Microelectron. Reliab. 51(5): 946-952 (2011) - [j41]Wenbin Wang, Michael G. Pecht:
Economic Analysis of Canary-Based Prognostics and Health Management. IEEE Trans. Ind. Electron. 58(7): 3077-3089 (2011) - [j40]Zhenhua Wen, Hongfu Zuo, Michael G. Pecht:
Electrostatic Monitoring of Gas Path Debris for Aero-engines. IEEE Trans. Reliab. 60(1): 33-40 (2011) - [c15]Jun Dai, Diganta Das, Michael G. Pecht:
Prognostics-based health management for telecom equipment under free air cooling. EUROCON 2011: 1-4 - [c14]Shunfeng Cheng, Diganta Das, Michael G. Pecht:
Using Failure Modes, Mechanisms, and Effects Analysis in Medical Device Adverse Event Investigations. ICBO 2011 - [c13]Wenbin Wang, Yifang Liu, Michael G. Pecht:
A theoretical model to minimize the operational cost for canary-equipped electronic system's health management. ISI 2011: 233-238 - [c12]Yinjiao Xing, Qiang Miao, Kwok-Leung Tsui, Michael G. Pecht:
Prognostics and health monitoring for lithium-ion battery. ISI 2011: 242-247 - 2010
- [j39]Sachin Kumar, Eli Dolev, Michael G. Pecht:
Parameter selection for health monitoring of electronic products. Microelectron. Reliab. 50(2): 161-168 (2010) - [j38]Michael G. Pecht, Rubyca Jaai:
A prognostics and health management roadmap for information and electronics-rich systems. Microelectron. Reliab. 50(3): 317-323 (2010) - [j37]Gang Niu, Bo-Suk Yang, Michael G. Pecht:
Development of an optimized condition-based maintenance system by data fusion and reliability-centered maintenance. Reliab. Eng. Syst. Saf. 95(7): 786-796 (2010) - [j36]Wenbin Wang, Dragan Banjevic, Michael G. Pecht:
A multi-component and multi-failure mode inspection model based on the delay time concept. Reliab. Eng. Syst. Saf. 95(8): 912-920 (2010) - [j35]Shunfeng Cheng, Michael H. Azarian, Michael G. Pecht:
Sensor Systems for Prognostics and Health Management. Sensors 10(6): 5774-5797 (2010) - [j34]Sachin Kumar, Tommy W. S. Chow, Michael G. Pecht:
Approach to Fault Identification for Electronic Products Using Mahalanobis Distance. IEEE Trans. Instrum. Meas. 59(8): 2055-2064 (2010) - [j33]Vasilis A. Sotiris, Peter W. Tse, Michael G. Pecht:
Anomaly Detection Through a Bayesian Support Vector Machine. IEEE Trans. Reliab. 59(2): 277-286 (2010) - [c11]Nishad Patil, Diganta Das, Michael G. Pecht:
Mahalanobis Distance Approach for Insulated Gate Bipolar Transistors Diagnostics. CE 2010: 643-651
2000 – 2009
- 2009
- [j32]Jon G. Elerath, Michael G. Pecht:
A Highly Accurate Method for Assessing Reliability of Redundant Arrays of Inexpensive Disks (RAID). IEEE Trans. Computers 58(3): 289-299 (2009) - [j31]Leoncio D. Lopez, Michael G. Pecht:
Modeling of IC Socket Contact Resistance for Reliability and Health Monitoring Applications. IEEE Trans. Reliab. 58(2): 264-270 (2009) - [j30]Nishad Patil, Jose Celaya, Diganta Das, Kai Goebel, Michael G. Pecht:
Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics. IEEE Trans. Reliab. 58(2): 271-276 (2009) - [j29]Shuang Yang, Ji Wu, Michael G. Pecht:
Reliability Assessment of Land Grid Array Sockets Subjected to Mixed Flowing Gas Environment. IEEE Trans. Reliab. 58(4): 634-640 (2009) - [c10]Chaitanya Sankavaram, Bharath R. Pattipati, Anuradha Kodali, Krishna R. Pattipati, Mohammad Azam, Sachin Kumar, Michael G. Pecht:
Model-based and data-driven prognosis of automotive and electronic systems. CASE 2009: 96-101 - [c9]Shunfeng Cheng, Michael G. Pecht:
A fusion prognostics method for remaining useful life prediction of electronic products. CASE 2009: 102-107 - 2008
- [j28]Haiyu Qi, Sanka Ganesan, Michael G. Pecht:
No-fault-found and intermittent failures in electronic products. Microelectron. Reliab. 48(5): 663-674 (2008) - [j27]Tadahiro Shibutani, Qiang Yu, Masaki Shiratori, Michael G. Pecht:
Pressure-induced tin whisker formation. Microelectron. Reliab. 48(7): 1033-1039 (2008) - [j26]Tadahiro Shibutani, Ji Wu, Qiang Yu, Michael G. Pecht:
Key reliability concerns with lead-free connectors. Microelectron. Reliab. 48(10): 1613-1627 (2008) - [c8]Sachin Kumar, Myra Torres, Y. C. Chan, Michael G. Pecht:
A hybrid prognostics methodology for electronic products. IJCNN 2008: 3479-3485 - 2007
- [j25]Yuki Fukuda, Michael D. Osterman, Michael G. Pecht:
The impact of electrical current, mechanical bending, and thermal annealing on tin whisker growth. Microelectron. Reliab. 47(1): 88-92 (2007) - [j24]Peter Sandborn, Michael G. Pecht:
Introduction to special section on electronic systems prognostics and health management. Microelectron. Reliab. 47(12): 1847-1848 (2007) - [j23]Jie Gu, Donald Barker, Michael G. Pecht:
Prognostics implementation of electronics under vibration loading. Microelectron. Reliab. 47(12): 1849-1856 (2007) - [j22]Mohammadreza Keimasi, Michael H. Azarian, Michael G. Pecht:
Isothermal aging effects on flex cracking of multilayer ceramic capacitors with standard and flexible terminations. Microelectron. Reliab. 47(12): 2215-2225 (2007) - [c7]Shunfeng Cheng, Michael G. Pecht:
Multivariate State Estimation Technique for Remaining Useful Life Prediction of Electronic Products. AAAI Fall Symposium: Artificial Intelligence for Prognostics 2007: 26-32 - [c6]Jie Gu, Donald Barker, Michael G. Pecht:
Uncertainty Assessment of Prognostics of Electronics Subject to Random Vibration. AAAI Fall Symposium: Artificial Intelligence for Prognostics 2007: 50-57 - [c5]Sachin Kumar, Michael G. Pecht:
Health Monitoring of Electronic Products Using Symbolic Time Series Analysis. AAAI Fall Symposium: Artificial Intelligence for Prognostics 2007: 73-80 - [c4]Vasilis A. Sotiris, Michael G. Pecht:
Support Vector Prognostics Analysis of Electronic Products and Systems. AAAI Fall Symposium: Artificial Intelligence for Prognostics 2007: 121-128 - [c3]Jon G. Elerath, Michael G. Pecht:
Enhanced Reliability Modeling of RAID Storage Systems. DSN 2007: 175-184 - 2006
- [j21]Michael G. Pecht, Yuliang Deng:
Electronic device encapsulation using red phosphorus flame retardants. Microelectron. Reliab. 46(1): 53-62 (2006) - [j20]Mohammadreza Keimasi, Sanka Ganesan, Michael G. Pecht:
Low temperature electrical measurements of silicon bipolar monolithic microwave integrated circuit (MMIC) amplifiers. Microelectron. Reliab. 46(2-4): 326-334 (2006) - [j19]Sanka Ganesan, Michael G. Pecht, Sharon Ling:
Use of high temperature operating life data to mitigate risks in long-duration space applications that deploy commercial-grade plastic encapsulated semiconductor devices. Microelectron. Reliab. 46(2-4): 360-366 (2006) - [j18]Daniel N. Donahoe, Michael G. Pecht, Isabel K. Lloyd, Sanka Ganesan:
Moisture induced degradation of multilayer ceramic capacitors. Microelectron. Reliab. 46(2-4): 400-408 (2006) - [j17]Tong Fang, Michael D. Osterman, Michael G. Pecht:
Statistical analysis of tin whisker growth. Microelectron. Reliab. 46(5-6): 846-849 (2006) - [c2]Yan Liu, Michael G. Pecht:
Reduction of Skin Stretch Induced Motion Artifacts in Electrocardiogram Monitoring Using Adaptive Filtering. EMBC 2006: 6045-6048 - 2004
- [j16]Arun Ramakrishnan, Michael G. Pecht:
Load characterization during transportation. Microelectron. Reliab. 44(2): 333-338 (2004) - [j15]Jingsong Xie, Michael G. Pecht:
Contact discontinuity modeling of electromechanical switches. IEEE Trans. Reliab. 53(2): 279-283 (2004) - 2003
- [j14]C. Hillman, B. Castillo, Michael G. Pecht:
Diffusion and absorption of corrosive gases in electronic encapsulants. Microelectron. Reliab. 43(4): 635-643 (2003) - [j13]Ping Zhao, Michael G. Pecht:
Field failure due to creep corrosion on components with palladium pre-plated leadframes. Microelectron. Reliab. 43(5): 775-783 (2003) - 2002
- [j12]Ninoslav Stojadinovic, Michael G. Pecht:
Editorial. Microelectron. Reliab. 42(4-5): 463 (2002) - [j11]Dawn A. Thomas, Ken Ayers, Michael G. Pecht:
The "trouble not identified" phenomenon in automotive electronics. Microelectron. Reliab. 42(4-5): 641-651 (2002) - [j10]Leon Lantz, Seongdeok Hwang, Michael G. Pecht:
Characterization of plastic encapsulant materials as a baseline for quality assessment and reliability testing. Microelectron. Reliab. 42(8): 1163-1170 (2002) - [j9]Michael G. Pecht, Diganta Das, Arun Ramakrishnan:
The IEEE standards on reliability program and reliability prediction methods for electronic equipment. Microelectron. Reliab. 42(9-11): 1259-1266 (2002) - [c1]Ricky Valentin, Jeremy Cunningham, Michael D. Osterman, Abhijit Dasgupta, Michael G. Pecht, Dinos Tsagos:
Weapon and communication systems: virtual life assessment of electronic hardware used in the Advanced Amphibious Assault Vehicle (AAAV). WSC 2002: 948-953 - 2001
- [j8]Ninoslav Stojadinovic, Michael G. Pecht:
Editorial. Microelectron. Reliab. 41(1): 1 (2001) - [j7]Jingsong Xie, Michael G. Pecht, David DeDonato, Ali Hassanzadeh:
An investigation of the mechanical behavior of conductive elastomer interconnects. Microelectron. Reliab. 41(2): 281-286 (2001) - [j6]Ninoslav Stojadinovic, Michael G. Pecht:
In memory of D. Stewart Peck. Microelectron. Reliab. 41(4): 481 (2001) - [j5]Bharatwaj Ramakrishnan, Peter Sandborn, Michael G. Pecht:
Process capability indices and product reliability. Microelectron. Reliab. 41(12): 2067-2070 (2001)
1990 – 1999
- 1996
- [j4]Michael G. Pecht:
MilSpecs - To Be Or Not To Be. IEEE Trans. Reliab. 45(2) (1996) - 1994
- [j3]Michael G. Pecht, Franklin R. Nash:
Predicting the reliability of electronic equipment. Proc. IEEE 82(7): 992-1004 (1994) - 1990
- [j2]Michael D. Osterman, Michael G. Pecht:
Placement for reliability and routability of convectively cooled PWBs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(7): 734-744 (1990)
1980 – 1989
- 1987
- [j1]Shapour Azarm, Michael G. Pecht:
A Coupled Algorithmic-Heuristic Approach for Design Optimization. IEEE Trans. Syst. Man Cybern. 17(2): 289-293 (1987)
Coauthor Index
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