"A Novel Three-Probability Spaces Logic Decoupling Distillation for ..."

Yu Sun et al. (2023)

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DOI: 10.1109/TIM.2023.3284130

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type: Journal Article

metadata version: 2023-12-17

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Yu Sun, Lei Su, Jiefei Gu, Ke Li, Michael G. Pecht:
A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection. IEEE Trans. Instrum. Meas. 72: 1-10 (2023)

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