"Analysis of Standards-Based Counterfeit Microelectronics Detection Methods."

Devon R. Richman et al. (2025)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2025.3526518

access: open

type: Journal Article

metadata version: 2025-01-25

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/RichmanADP25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/RichmanADP25
Devon R. Richman, Michael H. Azarian, Diganta Das, Michael G. Pecht:
Analysis of Standards-Based Counterfeit Microelectronics Detection Methods. IEEE Access 13: 7691-7704 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.