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2020 – today
- 2021
[j11]Changyong Lee
, Sugyeong Jo, Daeil Kwon, Michael G. Pecht:
Capacity-Fading Behavior Analysis for Early Detection of Unhealthy Li-Ion Batteries. IEEE Trans. Ind. Electron. 68(3): 2659-2666 (2021)- [j10]Seokgoo Kim, Hyung Jun Park, Jooho Choi, Daeil Kwon:
A Novel Prognostics Approach Using Shifting Kernel Particle Filter of Li-Ion Batteries Under State Changes. IEEE Trans. Ind. Electron. 68(4): 3485-3493 (2021)
2010 – 2019
- 2019
- [j9]Kyoungmin Koo, Daeil Kwon:
Dynamics of Bubble Behavior in Nucleate Boiling of R134a in an Enhanced Horizontal Tube. IEEE Access 7: 182444-182450 (2019) - [j8]Yeong-gwang Oh, Kasin Ransikarbum, Moise Busogi, Daeil Kwon, Namhun Kim:
Adaptive SVM-based real-time quality assessment for primer-sealer dispensing process of sunroof assembly line. Reliab. Eng. Syst. Saf. 184: 202-212 (2019) - [j7]Jinwoo Lee, Daeil Kwon, Namhun Kim, Changyong Lee:
PHM-based wiring system damage estimation for near zero downtime in manufacturing facilities. Reliab. Eng. Syst. Saf. 184: 213-218 (2019) - [j6]Jinwoo Lee, Daeil Kwon, Michael G. Pecht:
Reduction of Li-ion Battery Qualification Time Based on Prognostics and Health Management. IEEE Trans. Ind. Electron. 66(9): 7310-7315 (2019) - 2018
- [j5]Changyong Lee, Daeil Kwon:
A similarity based prognostics approach for real time health management of electronics using impedance analysis and SVM regression. Microelectron. Reliab. 83: 77-83 (2018) - [j4]Insun Shin, Kyoungmin Koo, Daeil Kwon:
Development of a Non-Invasive On-Chip Interconnect Health Sensing Method Based on Bit Error Rates. Sensors 18(10): 3234 (2018) - 2017
- [j3]Shun-Feng Su, Imre J. Rudas, Jacek M. Zurada, Meng Joo Er, Jyh-Horng Chou, Daeil Kwon:
Industry 4.0: A Special Section in IEEE Access. IEEE Access 5: 12257-12261 (2017) - [j2]Jinwoo Lee, Daeil Kwon:
A digital technique for diagnosing interconnect degradation by using digital signal characteristics. Microelectron. J. 60: 87-93 (2017) - 2016
- [j1]Daeil Kwon, Melinda R. Hodkiewicz, Jiajie Fan, Tadahiro Shibutani, Michael G. Pecht:
IoT-Based Prognostics and Systems Health Management for Industrial Applications. IEEE Access 4: 3659-3670 (2016)
Coauthor Index
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