"Development of a Non-Invasive On-Chip Interconnect Health Sensing Method ..."

Insun Shin, Kyoungmin Koo, Daeil Kwon (2018)

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DOI: 10.3390/S18103234

access: open

type: Journal Article

metadata version: 2018-11-30

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Insun Shin, Kyoungmin Koo, Daeil Kwon:
Development of a Non-Invasive On-Chip Interconnect Health Sensing Method Based on Bit Error Rates. Sensors 18(10): 3234 (2018)

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