"Uncertainty Assessment of Prognostics of Electronics Subject to Random ..."

Jie Gu, Donald Barker, Michael G. Pecht (2007)

> Home

Details and statistics

DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-28

- view
  - electronic edition @ aaai.org
- export record
  dblp key:
  - conf/aaaifs/GuBP07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/aaaifs/GuBP07
Jie Gu, Donald Barker, Michael G. Pecht:
Uncertainty Assessment of Prognostics of Electronics Subject to Random Vibration. AAAI Fall Symposium: Artificial Intelligence for Prognostics 2007: 50-57

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.