"Risk of tin whiskers in the nuclear industry."

Chien-Ming Huang et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.12.019

access: closed

type: Journal Article

metadata version: 2021-10-04

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Chien-Ming Huang, Daniel Nunez, James Coburn, Michael G. Pecht:
Risk of tin whiskers in the nuclear industry. Microelectron. Reliab. 81: 22-30 (2018)

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