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ORCID26th ETS 2021: Bruges, Belgium
- 26th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, May 24-28, 2021. IEEE 2021, ISBN 978-1-6654-1849-2
- Obi Nnorom, Jalil Morris, Ilias Giechaskiel, Jakub Szefer:
Chill Out: Freezing Attacks on Capacitors and DC/DC Converters. 1-2 - Changming Cui, Junlin Huang:
A 3DIC interconnect interface test and repair scheme based on Hybrid IEEE1838 Die Wrapper Register and BIST circuit. 1-2 - Ralf Arnold:
A Tutorial of How to Ensure High Automotive Microcontroller Quality. 1-2 - Wenke Jin, Siqi Lu, Xiaojun Cai:
ESD-PCM: Constructing Reliable Super Dense Phase Change Memory Under Write Disturbance. 1-6 - Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori:
MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM. 1-6 - Antonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos:
BIST-Assisted Analog Fault Diagnosis. 1-6 - Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen
:
Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring. 1-4 - Mohammad Rasoul Roshanshah, Katayoon Basharkhah, Zainalabedin Navabi:
Online Testing of a Row-Stationary Convolution Accelerator. 1-2 - Abdullah Ash-Saki, Mahabubul Alam, Koustubh Phalak, Aakarshitha Suresh, Rasit Onur Topaloglu, Swaroop Ghosh:
A Survey and Tutorial on Security and Resilience of Quantum Computing. 1-10 - Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Intermittent Undefined State Fault in RRAMs. 1-6 - Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. 1-4 - Soham Roy, Spencer K. Millican, Vishwani D. Agrawal:
Unsupervised Learning in Test Generation for Digital Integrated Circuits. 1-4 - Vedika Saravanan, Samah Mohamed Saeed:
Test Data-Driven Machine Learning Models for Reliable Quantum Circuit Output. 1-6 - Alberto Bosio, Ian O'Connor, Marcello Traiola, Jorge Echavarria, Jürgen Teich, Muhammad Abdullah Hanif, Muhammad Shafique, Said Hamdioui, Bastien Deveautour, Patrick Girard, Arnaud Virazel, Koen Bertels:
Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*. 1-10 - Sebastian Brandhofer, Simon J. Devitt, Ilia Polian:
ArsoNISQ: Analyzing Quantum Algorithms on Near-Term Architectures. 1-6 - Erik Larsson, Shashi Kiran Gangaraju, Prathamesh Murali:
System-Level Access to On-Chip Instruments. 1-6 - Heba Salem, Nigel P. Topham:
Trustworthy computing on untrustworthy and Trojan-infected on-chip interconnects. 1-2 - Ankush Mamgain, Manuel J. Barragán, Salvador Mir:
Analysis and mitigation of timing inaccuracies in high-frequency on-chip sinusoidal signal generators based on harmonic cancellation. 1-6 - Fotios Vartziotis:
TDMS Test Scheduler: An Integrated Framework for Test Scheduling of DVFS-based SoCs with Multiple Voltage Islands. 1-2 - Sk Subidh Ali, Yogendra Sao, Santosh Biswas:
Opacity preserving Countermeasure using Finite State Machines against Differential Scan Attacks. 1-2 - Maria Mushtaq, David Novo, Florent Bruguier, Pascal Benoit, Muhammad Khurram Bhatti:
Transit-Guard: An OS-based Defense Mechanism Against Transient Execution Attacks. 1-2 - Masoomeh Karami, Mohammad Hashem Haghbayan, Masoumeh Ebrahimi, Antonio Miele, Hannu Tenhunen, Juha Plosila:
Hierarchical Fault Simulation of Deep Neural Networks on Multi-Core Systems. 1-2 - Fabio Pavanello, Ian O'Connor, Ulrich Rührmair, Amy C. Foster, Dimitris Syvridis:
Recent Advances in Photonic Physical Unclonable Functions. 1-10 - Mohammad Farmani, Mark M. Tehranipoor, Fahim Rahman:
RHAT: Efficient RowHammer-Aware Test for Modern DRAM Modules. 1-6 - Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim:
Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces. 1-10 - G. Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui:
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. 1-6 - Guillem Cabo, Francisco Bas, Ruben Lorenzo, David Trilla, Sergi Alcaide, Miquel Moretó, Carles Hernández, Jaume Abella:
SafeSU: an Extended Statistics Unit for Multicore Timing Interference. 1-4 - Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori:
NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories. 1-6 - Michail Mavropoulos, Georgios Keramidas, Dimitris Nikolos:
Run Time Management of Faulty Data Caches. 1-6 - Jaume Abella, Sergi Alcaide, Jens Anders, Francisco Bas, Steffen Becker, Elke De Mulder, Nourhan Elhamawy, Frank K. Gürkaynak, Helena Handschuh, Carles Hernández, Michael Hutter, Leonidas Kosmidis, Ilia Polian, Matthias Sauer, Stefan Wagner, Francesco Regazzoni:
Security, Reliability and Test Aspects of the RISC-V Ecosystem. 1-10 - Negar Aghapour Sabbagh, Bijan Alizadeh:
Arithmetic Circuit Correction by Adding Optimized Correctors Based on Groebner Basis Computation. 1-6 - Katherine Shu-Min Li, Leon Li-Yang Chen, Ken Chau-Cheung Cheng, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Nova Cheng-Yen Tsai, Leon Chou, Gus Chang-Hung Han, Jwu E. Chen, Hsing-Chung Liang, Chun-Lung Hsu:
Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering. 1-2 - Syed Farah Naz, Ambika Prasad Shah, Suhaib Ahmed, Patrick Girard, Michael Waltl:
Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata. 1-2 - Fin Hendrik Bahnsen, Jan Kaiser, Görschwin Fey:
Designing Recurrent Neural Networks for Monitoring Embedded Devices. 1-4 - Teresa L. McLaurin, Frank Frederick, Heath Perry, Shawn Hung, Saurabh Sinha:
Applying IEEE Std 1838 to the 3DIC Design Trishul - A Case Study. 1-4 - Bartosz Grzelak, Martin Keim, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
Convolutional Compaction-Based MRAM Fault Diagnosis. 1-6 - Hua-Ren Li, Hsing-Chung Liang:
GPU-based ATPG System by Scaling Memory Usage and Reducing Data Transfer. 1-2 - Ioannis Tsounis, Athanasios Papadimitriou, Mihalis Psarakis:
Analyzing the Impact of Approximate Adders on the Reliability of FPGA Accelerators. 1-2 - Francesco Lorenzelli, Zhan Gao, Joe Swenton, Santosh Malagi, Erik Jan Marinissen:
Speeding up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis. 1-6 - Gilad Dar, Avihay Grigiac, David Peled, Yagel Ashkenazi, Menachem Goldzweig, Yoav Weizman, Osnat Keren:
Compact Protection Codes for protecting memory from malicious data and address manipulations. 1-6 - Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero:
Exploiting Active Learning for Microcontroller Performance Prediction. 1-4 - Thibault Vayssade, Mouhamad Chehaitly, Florence Azaïs, Laurent Latorre, François Lefèvre:
Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli. 1-6 - Sandip Ray, Arani Sinha:
Synergies Between Delay Test and Post-silicon Speed Path Validation: A Tutorial Introduction. 1-4 - S. Lapeyre, Nicolas Valette, Marc Merandat, Marie-Lise Flottes, Bruno Rouzeyre, Arnaud Virazel:
A Plug and Play Digital ABIST Controller for Analog Sensors in Secure Devices. 1-4
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