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2020 – today
- 2024
[c17]K. Tahraoui, T. Vayssade, François Lefèvre, Laurent Latorre, Florence Azaïs:
Digital generation of single tone FM/PM test stimuli: a theoretical analysis. LATS 2024: 1-6- 2023
- [j7]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. J. Electron. Test. 39(2): 155-170 (2023) - [c16]Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre:
Low-cost digital solution for production test of ZigBee transmitters Special Session "AMS-RF testing". LATS 2023: 1-2 - 2021
- [j6]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit. J. Electron. Test. 37(2): 225-242 (2021) - [j5]T. Vayssade
, Florence Azaïs, Laurent Latorre, François Lefèvre:
Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(11): 2400-2410 (2021) - [c15]Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre:
Digital test of ZigBee transmitters: Validation in industrial test environment. DATE 2021: 396-401 - [c14]Thibault Vayssade, Mouhamad Chehaitly, Florence Azaïs, Laurent Latorre, François Lefèvre:
Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli. ETS 2021: 1-6 - [c13]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, François Lefèvre:
Exploring on-line RF performance monitoring based on the indirect test strategy. LATS 2021: 1-7 - 2020
- [j4]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits. J. Electron. Test. 36(2): 189-203 (2020) - [c12]T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefevre:
EVM measurement of RF ZigBee transceivers using standard digital ATE. DFT 2020: 1-6 - [c11]Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel:
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. IOLTS 2020: 1-4 - [c10]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot:
Implementing indirect test of RF circuits without compromising test quality: a practical case study. LATS 2020: 1-6
2010 – 2019
- 2019
- [c9]T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition. ETS 2019: 1-6 - [c8]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Use of ensemble methods for indirect test of RF circuits: can it bring benefits? LATS 2019: 1-6 - [c7]Hassan El Badawi, Mariane Comte, Florence Azaïs, Vincent Kerzèrho, Serge Bernard, François Lefevre:
Which metrics to use for RF indirect test strategy? SMACD 2019: 73-76 - 2018
- [c6]T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE. IOLTS 2018: 17-22 - 2016
- [j3]Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre:
SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE. J. Electron. Test. 32(1): 69-82 (2016) - [j2]Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre:
Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits. J. Circuits Syst. Comput. 25(3): 1640014:1-1640014:18 (2016) - 2015
- [j1]Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range. J. Electron. Test. 31(5-6): 443-459 (2015) - [c5]Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre:
Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals. DDECS 2015: 237-242 - [c4]Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre:
A new technique for low-cost phase noise production testing from 1-bit signal acquisition. ETS 2015: 1-6 - [c3]Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre:
A digital technique for the evaluation of SSB phase noise of analog/RF signals. LATS 2015: 1-6 - 2014
- [c2]Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Low-cost phase noise testing of complex RF ICs using standard digital ATE. ITC 2014: 1-9 - [c1]Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Phase noise measurement on IF analog signals using standard digital ATE resources. NEWCAS 2014: 121-124
Coauthor Index
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