"Low-cost phase noise testing of complex RF ICs using standard digital ATE."

Stephane David-Grignot et al. (2014)

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DOI: 10.1109/TEST.2014.7035301

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Low-cost phase noise testing of complex RF ICs using standard digital ATE. ITC 2014: 1-9

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