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ORCIDJournal of Electronic Testing, Volume 36
Volume 36, Number 1, February 2020
- Vishwani D. Agrawal:
Editorial. 1-2 - New Editor - 2020. 3
- 2019 Reviewers. 5-6
- Test Technology Newsletter February 2020. 7-8
- Seyed Mostafa Banitaba, Roya M. Ahari
, Mahdi Karbasian:
Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated Components. 9-21 - Ricardo Aquino Guazzelli, Matheus Garay Trindade, Leonel Acunha Guimaraes, Thiago Ferreira de Paiva Leite, Laurent Fesquet, Rodrigo Possamai Bastos:
Trojan Detection Test for Clockless Circuits. 23-31 - Bastien Deveautour, Arnaud Virazel, Patrick Girard, Valentin Gherman:
On Using Approximate Computing to Build an Error Detection Scheme for Arithmetic Circuits. 33-46 - Alejandro Serrano-Cases, Felipe Restrepo-Calle, Sergio Cuenca-Asensi, Antonio Martínez-Álvarez:
Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems. 47-57 - Avishek Choudhury, Biplab K. Sikdar:
Modeling Remapping Based Fault Tolerance Techniques for Chip Multiprocessor Cache with Design Space Exploration. 59-73 - Zhexi Yao, Lingchao Zhu, Tao Zhang, Jinbo Wang:
Optimal Selection of Tests for Fault Diagnosis in Multi-Path System with Time-delay. 75-86 - Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik:
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors. 87-103 - Mousum Handique, Jatindra Kumar Deka, Santosh Biswas:
An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits. 105-122 - Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal:
Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures. 123-133 - Sujit Kumar Patel, Bharat Garg, Shireesh Kumar Rai:
An Efficient Accuracy Reconfigurable CLA Adder Designs Using Complementary Logic. 135-142
Volume 36, Number 2, April 2020
- Vishwani D. Agrawal:
Editorial. 143-144 - Test Technology Newsletter. 145-146
- Ankush Srivastava, Prokash Ghosh:
A Novel Approach of Data Content Zeroization Under Memory Attacks. 147-167 - S. Rathnapriya, V. Manikandan:
Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter. 169-181 - Jinqun Ge, Tian Xia, Guoan Wang:
Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin Films. 183-188 - Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits. 189-203 - Xijun Huang, Chuan-pei Xu, Long Zhang:
An Efficient Algorithm for Optimizing the Test Path of Digital Microfluidic Biochips. 205-218 - Gaurav Sharma, Lava Bhargava, Vinod Kumar:
Automated Bug Resistant Test Intent with Register Header Database for Optimized Verification. 219-237 - Tanusree Kaibartta, G. P. Biswas, Debesh Kumar Das:
Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs. 239-253 - Ambika Prasad Shah, Santosh Kumar Vishvakarma, Michael Hübner:
Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications. 255-269 - Thiago Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls:
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects. 271-284 - Mahtab Fooladi, Arezoo Kamran:
Speed-Up in Test Methods Using Probabilistic Merit Indicators. 285-296
Volume 36, Number 3, June 2020
- Vishwani D. Agrawal:
Editorial. 297-298 - Test Technology Newsletter. 299-300
- Wendong Wang, Ujjwal Guin, Adit D. Singh:
Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices. 301-311 - Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, Gabriella Trucco, Elena I. Vatajelu:
Stuck-At Fault Mitigation of Emerging Technologies Based Switching Lattices. 313-326 - Sanjoy Mitra, Debaprasad Das:
An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic. 327-342 - Sushanth Varada, Swapnil Katpally, Subha Sri Lakshmi Thiruveedhi:
Comprehensive Analysis and Optimization of Reliable Viterbi Decoder Circuits Implemented in Modular VLSI Design Logic Styles. 343-363 - Dongzhe Yu, Han Wang, Jiangtao Xu:
Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation. 365-374 - Min Ma, Jing Huang, Xiaolei Yang, Lingfan Tang:
A probability density estimation algorithm on multiwavelet for the high-resolution ADC. 375-383 - Biswajit Bhowmik:
Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks. 385-408 - Ongun Yucesan, Altan Ozkil:
Time Complexity Comparison of Stopping at First Failure and Completely Running the Test. 409-417 - R. Jothin, M. Peer Mohamed:
High Performance Approximate Memories for Image Processing Applications. 419-428 - Bharat Garg, Sujit Kumar Patel, Sunil Dutt:
LoBA: A Leading One Bit Based Imprecise Multiplier for Efficient Image Processing. 429-437
Volume 36, Number 4, August 2020
- Vishwani D. Agrawal:
Editorial. 439-440 - Test Technology Newsletter. 441-443
- Eli Gurevich, Pranit Deshmukh:
New Method for Determining and Predicting Test Interconnect Pin Current Carrying Capacity. 445-460 - Baojun Liu, Li Cai, Xiaoqiang Liu:
An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS Circuits. 461-467 - Shuo Cai, Binyong He, Weizheng Wang, Peng Liu, Fei Yu, Lairong Yin, Bo Li:
Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults. 469-483 - Yong Deng, Ting Chen, Di Zhang:
Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform. 485-498 - Qiang Huang, Jin Jiang, Yongqiang Deng:
Evaluation of Ionizing Radiation Effects on Device Modules Used in Wireless-Based Monitoring Systems. 499-508 - Sumit Kumar Jindal, Ritobrita De, Ajay Kumar, Sanjeev Kumar Raghuwanshi:
Novel MEMS Piezoresistive Sensor with Hair-Pin Structure to Enhance Tensile and Compressive Sensitivity and Correct Non-Linearity. 509-517 - Ayan Palchaudhuri, Anindya Sundar Dhar:
Testable Architecture Design for Programmable Cellular Automata on FPGA Using Run-Time Dynamically Reconfigurable Look-Up Tables. 519-536 - Mamoru Ishizaka, Michihiro Shintani, Michiko Inoue:
Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor Circuit. 537-546 - Leonardo Bisch Piccoli, Renato V. B. Henriques, Tiago R. Balen:
Design of an Integrated System for On-line Test and Diagnosis of Rotary Actuators. 547-553 - Shahram Mohammadi, Reza Omidi Gosheblagh, Mohammad Lotfinejad:
Low-Power Area-Efficient Fault Tolerant Adder in Current Mode Multi Valued Logic Using Berger Codes. 555-563
Volume 36, Number 5, October 2020
- Vishwani D. Agrawal:
Editorial. 565-566 - Test Technology Newsletter. 567-568
- Valerie N. Livina, Adam P. Lewis, Martin Wickham:
Tipping Point Analysis of Electrical Resistance Data with Early Warning Signals of Failure for Predictive Maintenance. 569-576 - Azhaganantham Arulmurugan, Govindasamy Murugesan, Balasubramaniam Vivek:
Thermal-aware Test Data Compression for System-on-Chip Based on Modified Bitmask Based Methods. 577-590 - Ting Su, Shaoqing Li, Yongkang Tang, Jihua Chen:
Part I: Evaluation for Hardware Trojan Detection Based on Electromagnetic Radiation. 591-606 - Sivappriya Manivannan, Lakshmi Kuppusamy, N. Sarat Chandra Babu:
TRAP-GATE: A Probabilistic Approach to Enhance Hardware Trojan Detection and its Game Theoretic Analysis. 607-616 - Srdjan Djordjevic, Miroljub T. Pesic:
A Fault Verification Method Based on the Substitution Theorem and Voltage-Current Phase Relationship. 617-629 - Vipin Kumar:
Design Development and Testing of High Performance Microwave Frequency Up-Converter. 631-642 - Mahum Naseer, Waqar Ahmad, Osman Hasan:
Formal Verification of ECCs for Memories Using ACL2. 643-663 - Partha Mitra, Angsuman Sarkar:
Soft Computing Techniques Based CAD Approach for Power Supply Noise Reduction in System-on-Chip. 665-669 - Yury Parfenov, Vladimir Chepelev, Yuhao Chen, Yan-zhao Xie:
Role of the Pulse Repetition Rate when Assessing Electromagnetic Immunity of Electronic Devices. 671-676
Volume 36, Number 6, December 2020
- Vishwani D. Agrawal:
Editorial. 677-678 - 2019 JETTA-TTTC Best Paper Award. 679-680
- Test Technology Newsletter. 681-682
- Md Imran Momtaz, Abhijit Chatterjee:
Diagnosis and Compensation of Control Program, Sensor and Actuator Failures in Nonlinear Systems Using Hierarchical State Space Checks. 683-701 - Elbruz Ozen, Alex Orailoglu:
Low-Cost Error Detection in Deep Neural Network Accelerators with Linear Algorithmic Checksums. 703-718 - Sayandeep Sanyal, Mayukh Bhattacharya, Amit Patra, Pallab Dasgupta:
A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal Circuits. 719-730 - Ivan D. Meza-Ibarra, Víctor H. Champac, Roberto Gómez-Fuentes, Jose R. Noriega-Luna, A. Vera-Marquina:
Identification of Logic Paths Influenced by Severe Coupling Capacitances. 731-741 - Akin Gokalan, Suleyman Tosun, Deniz Dal:
Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAs. 743-756 - Davar Kheirandish, Majid Haghparast, Midia Reshadi, Mehdi Hosseinzadeh:
Efficient Designs of Reversible Majority Voters. 757-770 - Yuling Shang, Weipeng Tan, Chunquan Li, Haihua Fan, Lizhen Zeng:
Detection and Diagnosis of Multi-Fault for through Silicon Vias in 3D IC. 771-783 - Farouk Smith:
Proton Beam Validation of a New Single Event Transient Mitigation Technique. 785-792
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