"An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer ..."

Baojun Liu, Li Cai, Xiaoqiang Liu (2020)

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DOI: 10.1007/S10836-020-05891-4

access: closed

type: Journal Article

metadata version: 2020-09-19

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Baojun Liu, Li Cai, Xiaoqiang Liu:
An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS Circuits. J. Electron. Test. 36(4): 461-467 (2020)

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