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2020 – today
- 2024
[c16]Jaehoon Lee, Hyeonuk Son, Seohyun Kang, Dahyun Kang, Dongkwan Han, Jongsin Yun, Artur Pogiel, Etienne Racine, Krzysztof Jurga, Lori Schramm, Martin Keim:
Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies. ITC 2024: 280-285- [c15]Albert Au, Michal Kçpinski, Makary Orczyk, Artur Pogiel:
Power-Aware Test Scheduling for Memory BIST. ITC 2024: 384-390 - 2022
- [j7]Bartosz Kaczmarek
, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer:
LBIST for Automotive ICs With Enhanced Test Generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(7): 2290-2300 (2022) - 2021
- [c14]Bartosz Grzelak, Martin Keim, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
Convolutional Compaction-Based MRAM Fault Diagnosis. ETS 2021: 1-6
2010 – 2019
- 2017
- [c13]Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
ROM fault diagnosis for O(n2) test algorithms. ETS 2017: 1-6 - 2014
- [c12]Maciej Trawka, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jakub Janicki, Jerzy Tyszer:
High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs. ATS 2014: 74-80 - [c11]Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada:
Quality assurance in memory built-in self-test tools. DDECS 2014: 39-44 - 2011
- [j6]Nilanjan Mukherjee, Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer:
Ring Generator: An Ultimate Linear Feedback Shift Register. Computer 44(6): 64-71 (2011) - [j5]Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. J. Electron. Test. 27(5): 599-609 (2011) - [j4]Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
BIST-Based Fault Diagnosis for Read-Only Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(7): 1072-1085 (2011) - [c10]Grzegorz Mrugalski, Artur Pogiel, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Pawel Urbanek:
Fault Diagnosis in Memory BIST Environment with Non-march Tests. Asian Test Symposium 2011: 419-424 - [c9]Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. ETS 2011: 1-6 - 2010
- [j3]Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
High Volume Diagnosis in Memory BIST Based on Compressed Failure Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(3): 441-453 (2010) - [c8]Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Diagnosis of failing scan cells through orthogonal response compaction. ETS 2010: 221-226
2000 – 2009
- 2009
- [c7]Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
Fault diagnosis for embedded read-only memories. ITC 2009: 1-10 - [c6]Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
High-Speed On-Chip Event Counters for Embedded Systems. VLSI Design 2009: 275-280 - 2008
- [c5]Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST. ITC 2008: 1-10 - 2007
- [j2]Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer:
Isolation of Failing Scan Cells through Convolutional Test Response Compaction. J. Electron. Test. 23(1): 35-45 (2007) - [j1]Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
Fault Diagnosis With Convolutional Compactors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(8): 1478-1494 (2007) - 2006
- [c4]Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
Convolutional Compactors with Variable Polynomials. ETS 2006: 117-122 - 2005
- [c3]Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer, Chen Wang:
Convolutional compaction-driven diagnosis of scan failures. ETS 2005: 176-181 - [c2]Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
Diagnosis with convolutional compactors in presence of unknown states. ITC 2005: 10 - 2004
- [c1]Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski:
Fault Diagnosis in Designs with Convolutional Compactors. ITC 2004: 498-507
Coauthor Index
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