"A 3DIC interconnect interface test and repair scheme based on Hybrid ..."

Changming Cui, Junlin Huang (2021)

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DOI: 10.1109/ETS50041.2021.9465378

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-02

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Changming Cui, Junlin Huang:
A 3DIC interconnect interface test and repair scheme based on Hybrid IEEE1838 Die Wrapper Register and BIST circuit. ETS 2021: 1-2

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