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ORCIDAlkis A. Hatzopoulos
Alkiviades A. Hatzopoulos – Alkiviadis A. Hatzopoulos
Person information
- affiliation: Aristotle University of Thessaloniki, Greece
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2020 – today
- 2024
[j19]Nikolaos Georgoulopoulos
, Theodora Mamali, Alkis A. Hatzopoulos:
Design and Verification of a SAR ADC SystemVerilog Real Number Model. J. Electron. Test. 40(3): 315-328 (2024)- 2023
- [c50]Andreas Tsiougkos, Alkis A. Hatzopoulos, Vasilis F. Pavlidis:
Mismatch Driven Systematic Design Methodology for Transistor Based Active Resistors. MWSCAS 2023: 619-623 - [i1]Panagiotis Bountzioukas, Georgios Kikas, Christoforos Tsiolakis, Dimitrios Stoupis, Eleftheria Chatziargyriou, Alkis A. Hatzopoulos, Vasiliki Kourampa-Gottfroh, Ilektra Karakosta-Amarantidou, Aggelos Mavropoulos, Ioannis-Nikolaos Komis, Afroditi Kita, David Palma, Loris Franchi:
The Evolution from Design to Verification of the Antenna System and Mechanisms in the AcubeSAT mission. CoRR abs/2310.16134 (2023) - 2022
- [j18]Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Takuji Miki, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen:
Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements. IEEE Des. Test 39(5): 79-87 (2022) - [c49]Dimitrios Samaras, Alkis A. Hatzopoulos:
A low power low noise 65nm charge pump using mismatch compensation and smoothing capacitor. MOCAST 2022: 1-4 - [c48]Dimitrios Samaras, Andreas Tsimpos, Alkis A. Hatzopoulos:
A novel wide frequency range 65nm CMOS VCO. VLSI-SoC 2022: 1-4 - 2021
- [j17]Vasileios Gerakis, Yiorgos Tsiatouhas, Alkis A. Hatzopoulos:
A Low-Cost, Robust and Tolerant, Digital Scheme for Post-Bond Testing and Diagnosis of TSVs. J. Electron. Test. 37(2): 191-203 (2021) - [j16]Nikolaos Georgoulopoulos, Alkiviades A. Hatzopoulos:
Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilog. J. Electron. Test. 37(5): 685-700 (2021) - [c47]Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen:
Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring. ETS 2021: 1-4 - [c46]Nikolaos Georgoulopoulos, Alkiviadis A. Hatzopoulos, Konstantinos Karamitsios, Irene-Maria Tabakis, Konstantinos Kotrotsios, Alexandros I. Metsai:
A Survey on Hardware Failure Prediction of Servers Using Machine Learning and Deep Learning. MOCAST 2021: 1-5 - [c45]Nikolaos Georgoulopoulos, Alkis A. Hatzopoulos, Konstantinos Karamitsios, Irene-Maria Tabakis, Konstantinos Kotrotsios, Alexandros I. Metsai:
Investigation and Simulation of Hardware Errors in Kernel Logs of Linux-based Server Systems. SEEDA-CECNSM 2021: 1-7 - 2020
- [c44]Vasileios Gerakis, Yiorgos Tsiatouhas, Alkis A. Hatzopoulos:
An Alternative Post-bond Testing Method for TSVs. MOCAST 2020: 1-4 - [c43]Dimitrios Samaras, Alkis A. Hatzopoulos:
High performance, wide tuning range 65nm CMOS tunable Voltage Controlled Ring Oscillator up to 11 GHz. MOCAST 2020: 1-4
2010 – 2019
- 2019
- [c42]Constantina Tsechelidou, Nikolaos Georgoulopoulos, Alkiviadis A. Hatzopoulos:
Design of a SystemVerilog-Based Sigma-Delta ADC Real Number Model. DSD 2019: 124-128 - [c41]Nikolaos Georgoulopoulos, Alkiviadis A. Hatzopoulos:
Design of a Digital PLL Real Number Model Using SystemVerilog. MOCAST 2019: 1-4 - [c40]Nikolaos Georgoulopoulos, Athanasios Mekras, Alkiviadis A. Hatzopoulos:
Design of a SystemVerilog-Based VCO Real Number Model. MOCAST 2019: 1-4 - [c39]Nikolaos Georgoulopoulos, Alkiviadis A. Hatzopoulos:
UVM-based Verification of a Digital PLL Using SystemVerilog. PATMOS 2019: 23-28 - 2018
- [c38]Leonidas Katselas, Alkis A. Hatzopoulos, Hailong Jiao, Christos Papameletis, Erik Jan Marinissen:
On-Chip Toggle Generators to Provide Realistic Conditions during Test of Digital 2D-SoCs and 3D-SICs. ITC 2018: 1-9 - [c37]Nikolaos Georgoulopoulos, Alkiviadis A. Hatzopoulos:
Efficiency evaluation of a SystemVerilog-based real number model. MOCAST 2018: 1-4 - [c36]Nikolaos Georgoulopoulos, Ioannis Giannou, Alkiviadis A. Hatzopoulos:
UVM-Based Verification of a Mixed-Signal Design Using SystemVerilog. PATMOS 2018: 97-102 - 2017
- [j15]Marcin Kaluza, Boguslaw Wiecek, Gilbert De Mey, Alkis A. Hatzopoulos, Vasilis Chatziathanasiou:
Thermal impedance measurement of integrated inductors on bulk silicon substrate. Microelectron. Reliab. 73: 54-59 (2017) - [c35]Sofia Lydia Ntella, Francesca Stradolini, Abuduwaili Tuoheti, Danilo Demarchi, Alkis A. Hatzopoulos, Sandro Carrara:
Architecture and procedures for pH and temperature monitoring in medical applications. IEEE SENSORS 2017: 1-3 - [c34]Nikolaos Georgoulopoulos, Alkiviadis A. Hatzopoulos:
Effectiveness evaluation of the TSV fault detection method using ring oscillators. MOCAST 2017: 1-4 - [c33]Stylianos-Georgios Papadopoulos, Vasileios Gerakis, Alkis A. Hatzopoulos:
Oscillation-based technique for TSV post-bond test considerations. MOCAST 2017: 1-4 - [c32]Leonidas Katselas, Hailong Jiao, Angelos Athanasiadis, Christos Papameletis, Alkis A. Hatzopoulos, Erik Jan Marinissen:
Embedded toggle generator to control the switching activity during test of digital 2D-SoCs and 3D-SICs. PATMOS 2017: 1-8 - [c31]Stylianos-Georgios Papadopoulos, Vasileios Gerakis, Yiorgos Tsiatouhas, Alkis A. Hatzopoulos:
Oscillation-based technique for post-bond parallel testing and diagnosis of multiple TSVs. PATMOS 2017: 1-6 - 2016
- [j14]Georgios Volanis, Angelos Antonopoulos, Alkis A. Hatzopoulos, Yiorgos Makris:
Toward Silicon-Based Cognitive Neuromorphic ICs - A Survey. IEEE Des. Test 33(3): 91-102 (2016) - 2015
- [c30]Vasileios Gerakis, Fontounasios Christos, Alkis A. Hatzopoulos:
Modeling the Coupling through Substrate for Frequencies up to 100GHz. DDECS 2015: 165-168 - [c29]Vasileios Gerakis, Leonidas Katselas, Alkis A. Hatzopoulos:
Fault modeling and testing of through silicon via interconnections. IOLTS 2015: 30-31 - 2014
- [c28]Vasileios Gerakis, Christina Avdikou, Alexandros Liolios, Alkis A. Hatzopoulos:
Modeling and analysis of cracked through silicon via (TSV) interconnections. DDECS 2014: 310-313 - [c27]Sotirios P. Pouros, Vassilios D. Vassios, Dimitrios K. Papakostas, Alkis A. Hatzopoulos:
Input stimulus comparison using an adaptive FPGA-based testing system. ISCAS 2014: 277-280 - [c26]Vasileios Gerakis, Alkis A. Hatzopoulos:
Substrate coupling noise considerations for frequencies up to 100GHz. MIXDES 2014: 351-355 - 2013
- [j13]Nikolaos A. Tsatsoulis, Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
Closed-form expressions for the coupling capacitance of metal fill tiles in VLSI circuits. Microelectron. J. 44(10): 953-958 (2013) - [j12]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alexandros I. Dimitriadis, Alkis A. Hatzopoulos:
Exact closed-form expressions for substrate resistance and capacitance extraction in nanoscale VLSI. Microelectron. J. 44(12): 1077-1083 (2013) - 2012
- [c25]Ilias Pappas, Stilianos Siskos, Alkis A. Hatzopoulos:
A new analog output buffer for data driver of active matrix displays using low-temperature polycrystalline silicon thin-film transistors. DDECS 2012: 284-287 - 2011
- [j11]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
An evolutionary method for efficient computation of mutual capacitance for VLSI circuits based on the method of images. Simul. Model. Pract. Theory 19(2): 638-648 (2011) - [j10]Alexios Spyronasios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
Wavelet Analysis for the Detection of Parametric and Catastrophic Faults in Mixed-Signal Circuits. IEEE Trans. Instrum. Meas. 60(6): 2025-2038 (2011) - [j9]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
A Nondestructive Method for Accurately Extracting Substrate Parameters of Arbitrary Doping Profile in Nanoscale VLSI. IEEE Trans. Instrum. Meas. 60(9): 3173-3184 (2011) - [c24]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
A memetic algorithm for computing 3D capacitance in multiconductor VLSI circuits. DDECS 2011: 341-346 - [c23]Rodoula Makri, Petros Tsenes, Dimitrios Economou, Yannis Papananos, Dimitrios Dervenis, Michael K. Birbas, John C. Kikidis, Vassilis Paliouras, Grigorios Kalivas, Alexios N. Birbas, Panos Karaivazoglou, Yorgos Stratakos, John Korinthios, Stelios Siskos, Alkis A. Hatzopoulos, John Komninos, Serafeim Katsikas, Konstantinos N. Voudouris, Andreas Rigas, George Agapiou, Polivios Raxis:
Next generation millimeter wave backhaul radio: Overall system design for GbE 60GHz PtP wireless radio of high CMOS integration. ICECS 2011: 338-341 - [c22]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
Efficient inductance calculation for long and medium length rectangular interconnects in VLSI circuits. ISCAS 2011: 2337-2340 - [c21]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
Prospects of 3D inductors on through silicon vias processes for 3D ICs. VLSI-SoC 2011: 90-93 - 2010
- [j8]Dimitris K. Papakostas, Alkis A. Hatzopoulos:
Improved analogue fault coverage estimation using probabilistic analysis. Int. J. Circuit Theory Appl. 38(5): 503-514 (2010) - [j7]Michael G. Dimopoulos, Alexios Spyronasios, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alkis A. Hatzopoulos:
Circuit Implementation of a Supply Current Spectrum Test Method. IEEE Trans. Instrum. Meas. 59(10): 2660-2670 (2010) - [c20]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
A GA-based method for efficient interconnect capacitance computation in mixed-signal integrated circuits using sets of linear charges. ICECS 2010: 962-965 - [c19]Michael G. Dimopoulos, Alexios Spyronasios, Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos:
Efficient testing of an optical feedback pixel driver using wavelet analysis. ICECS 2010: 1041-1044 - [c18]Michael G. Dimopoulos, Alexios Spyronasios, Alkis A. Hatzopoulos:
Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits. IOLTS 2010: 83-87 - [c17]Michael G. Dimopoulos, Dimitris K. Papakostas, Basilios D. Vassios, Alkis A. Hatzopoulos:
Wavelet analysis of current measurements for mixed-signal circuit testing. ISCAS 2010: 1923-1926 - [c16]Alexios Spyronasios, Michael G. Dimopoulos, Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos:
Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits Using Wavelets. ISVLSI 2010: 232-237
2000 – 2009
- 2009
- [j6]Maria Drakaki, Alkis A. Hatzopoulos, Stylianos Siskos:
De-embedding method for on-wafer RF CMOS inductor measurements. Microelectron. J. 40(6): 958-965 (2009) - 2008
- [j5]Dimitris K. Papakostas, Alkis A. Hatzopoulos:
A Unified Procedure for Fault Detection of Analog and Mixed-Mode Circuits Using Magnitude and Phase Components of the Power Supply Current Spectrum. IEEE Trans. Instrum. Meas. 57(11): 2589-2595 (2008) - [c15]Dimitrios K. Konstantinou, Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Alexios Spyronasios:
Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach. DDECS 2008: 251-254 - [c14]Michael G. Dimopoulos, Dimitris K. Papakostas, Alexios Spyronasios, Alkis A. Hatzopoulos, Dimitrios K. Konstantinou:
Power supply current testing in the production line of emergency luminaire circuits. ICECS 2008: 778-781 - 2007
- [c13]Maria Drakaki, Alkis A. Hatzopoulos, Stylianos Siskos:
Improving the quality factor estimation for differentially driven RF CMOS inductor. ECCTD 2007: 599-602 - [c12]Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Evdokimos I. Konstantinidis, Alexios Spyronasios:
Design and development of a versatile testing system for analog and mixed-signal circuits. ECCTD 2007: 846-849 - [c11]Michael G. Dimopoulos, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alexios Spyronasios, Alkis A. Hatzopoulos:
Multiple Parametric Circuit Analysis Tool for Detectability Estimation. ICECS 2007: 1111-1114 - [c10]Maria Drakaki, Alkis A. Hatzopoulos, Stylianos Siskos:
CMOS Inductor Performance Estimation using Z- and S-parameters. ISCAS 2007: 2256-2259 - 2006
- [j4]Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos:
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region. Microelectron. J. 37(11): 1313-1320 (2006) - [c9]Alkis A. Hatzopoulos, Stefanos Stefanou, Georges G. E. Gielen, Dominique Schreurs:
Assessment of parameter extraction methods for integrated inductor design and model validation. ISCAS 2006 - [c8]Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos:
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region. ISCAS 2006 - [c7]Ilias Pappas, Lazaros Nalpantidis, Vasilios Kalenteridis, Stilianos Siskos, Alkis A. Hatzopoulos, C. A. Dimitriadis:
A threshold voltage variation cancellation technique for analogue peripheral circuits of a display array using poly-Si TFTs. ISCAS 2006 - 2005
- [c6]Alkis A. Hatzopoulos, Stefanos Stefanou, Georges G. E. Gielen, Dominique Schreurs:
Analysis of coil parameter extraction methods for on-chip inductor design. ECCTD 2005: 39-42 - [c5]Alkis A. Hatzopoulos, Stelios Siskos, Charalambos A. Dimitriadis, Nikolaos P. Papadopoulos:
Built-in current sensor with reduced voltage drop using thin-film transistors. ISCAS (3) 2005: 2196-2199 - 2003
- [j3]Dimitris K. Papakostas, Alkis A. Hatzopoulos:
Estimation of circuit output measurements including statistically dependent parameters. Int. J. Circuit Theory Appl. 31(2): 219-228 (2003)
1990 – 1999
- 1999
- [c4]Alkis A. Hatzopoulos, An. Sifniadis:
Improved procedures for testing analog and mixed-signal systems using a microcontroller. ICECS 1999: 1651-1654 - 1996
- [c3]Dimitrios K. Papakostas, V. C. Kosmidis, Alkiviades A. Hatzopoulos:
Analog fault detectability based on statistical circuit analysis. ICECS 1996: 1076-1079 - [c2]Stelios Siskos, Theodore Laopoulos, Alkiviades A. Hatzopoulos, Marise Bafleur:
A current conveyor based BIC sensor for current monitoring in mixed-signal circuits. ICECS 1996: 1210-1212 - 1994
- [c1]Dimitris K. Papakostas, Alkis A. Hatzopoulos:
Fault Detection in Linear Bipolar ICs: Comparative Results Between Power Supply Current and Output Voltage Measurements. ISCAS 1994: 61-64 - 1993
- [j2]A. D. Athanasiadis, Alkis A. Hatzopoulos, G. Theophilidis:
A data-acquisition system for the analysis of the isometric tension generated by an electrically stimulated skeletal muscle. Comput. Appl. Biosci. 9(3): 325-330 (1993) - 1990
- [j1]Alkis A. Hatzopoulos, J. M. Kontoleon:
A new approach for automatic fault diagnosis in analogue circuits. Int. J. Circuit Theory Appl. 18(4): 387-400 (1990)
Coauthor Index
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