"Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements."

Kazuki Monta et al. (2022)

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DOI: 10.1109/MDAT.2022.3178050

access: closed

type: Journal Article

metadata version: 2022-09-22

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Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Takuji Miki, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen:
Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements. IEEE Des. Test 39(5): 79-87 (2022)

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