"Fault modeling and testing of through silicon via interconnections."

Vasileios Gerakis, Leonidas Katselas, Alkis A. Hatzopoulos (2015)

> Home

Details and statistics

DOI: 10.1109/IOLTS.2015.7229824

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iolts/GerakisKH15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iolts/GerakisKH15
Vasileios Gerakis, Leonidas Katselas, Alkis A. Hatzopoulos:
Fault modeling and testing of through silicon via interconnections. IOLTS 2015: 30-31

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.