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Christos Papameletis
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2020 – today
- 2022
- [c9]Brian Foutz, Sarthak Singhal, Prateek Kumar Rai, Krishna Chakravadhanula, Vivek Chickermane, Bharath Nandakumar, Sameer Chillarige, Christos Papameletis, Satish Ravichandran:
PPA Optimization of Test Points in Automotive Designs. ITC 2022: 204-212
2010 – 2019
- 2019
- [c8]Christos Papameletis, Vivek Chickermane, Brian Foutz, Sarthak Singhal, Krishna Chakravadhanula:
Optimized Physical DFT Synthesis of Unified Compression and LBIST for Automotive Applications. ITC 2019: 1-6 - 2018
- [c7]Leonidas Katselas, Alkis A. Hatzopoulos, Hailong Jiao, Christos Papameletis, Erik Jan Marinissen:
On-Chip Toggle Generators to Provide Realistic Conditions during Test of Digital 2D-SoCs and 3D-SICs. ITC 2018: 1-9 - 2017
- [c6]Krishna Chakravadhanula, Vivek Chickermane, Paul Cunningham, Brian Foutz, Dale Meehl, Louis Milano, Christos Papameletis, David Scott, Steev Wilcox:
Advancing test compression to the physical dimension. ITC 2017: 1-10 - [c5]Leonidas Katselas, Hailong Jiao, Angelos Athanasiadis, Christos Papameletis, Alkis A. Hatzopoulos, Erik Jan Marinissen:
Embedded toggle generator to control the switching activity during test of digital 2D-SoCs and 3D-SICs. PATMOS 2017: 1-8 - 2015
- [j1]Christos Papameletis, Brion L. Keller, Vivek Chickermane, Said Hamdioui, Erik Jan Marinissen:
A DfT Architecture and Tool Flow for 3-D SICs With Test Data Compression, Embedded Cores, and Multiple Towers. IEEE Des. Test 32(4): 40-48 (2015) - [c4]Konstantin Shibin, Vivek Chickermane, Brion L. Keller, Christos Papameletis, Erik Jan Marinissen:
At-Speed Testing of Inter-Die Connections of 3D-SICs in the Presence of Shore Logic. ATS 2015: 79-84 - 2014
- [c3]Erik Jan Marinissen, Bart De Wachter, Stephen O'Loughlin, Sergej Deutsch, Christos Papameletis, Tobias Burgherr:
Vesuvius-3D: A 3D-DfT demonstrator. ITC 2014: 1-10 - 2013
- [c2]Christos Papameletis, Brion L. Keller, Vivek Chickermane, Erik Jan Marinissen, Said Hamdioui:
Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers. ETS 2013: 1-6 - 2010
- [c1]Dimitris Bekiaris, Antonis Papanikolaou, Christos Papameletis, Dimitrios Soudris, George Economakos, Kiamal Z. Pekmestzi:
A Temperature-Aware Time-Dependent Dielectric Breakdown Analysis Framework. PATMOS 2010: 73-83
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