"Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated ..."

Alexios Spyronasios et al. (2010)

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DOI: 10.1109/ISVLSI.2010.36

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Alexios Spyronasios, Michael G. Dimopoulos, Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos:
Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits Using Wavelets. ISVLSI 2010: 232-237

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