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ORCIDMichael G. Dimopoulos
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- affiliation: IMAG, Grenoble, France
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2020 – today
- 2021
[j9]Michael G. Dimopoulos
, Michael Nicolaidis:
The Quest of the Ideal Error Detecting Architecture: The GRAAL Architecture. IEEE Trans. Sustain. Comput. 6(3): 493-506 (2021)
2010 – 2019
- 2016
- [c16]Michael Nicolaidis, Michael G. Dimopoulos:
Advanced double-sampling architectures. IOLTS 2016: 130-132 - 2014
- [j8]Michael G. Dimopoulos, Yi Gang, Lorena Anghel, Mounir Benabdenbi, Nacer-Eddine Zergainoh, Michael Nicolaidis:
Fault-tolerant adaptive routing under an unconstrained set of node and link failures for many-core systems-on-chip. Microprocess. Microsystems 38(6): 620-635 (2014) - 2013
- [j7]Nikolaos A. Tsatsoulis, Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
Closed-form expressions for the coupling capacitance of metal fill tiles in VLSI circuits. Microelectron. J. 44(10): 953-958 (2013) - [j6]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alexandros I. Dimitriadis, Alkis A. Hatzopoulos:
Exact closed-form expressions for substrate resistance and capacitance extraction in nanoscale VLSI. Microelectron. J. 44(12): 1077-1083 (2013) - [c15]Michael G. Dimopoulos, Yi Gang, Mounir Benabdenbi, Lorena Anghel, Nacer-Eddine Zergainoh, Michael Nicolaidis:
Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip. IOLTS 2013: 7-12 - 2011
- [j5]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
An evolutionary method for efficient computation of mutual capacitance for VLSI circuits based on the method of images. Simul. Model. Pract. Theory 19(2): 638-648 (2011) - [j4]Alexios Spyronasios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
Wavelet Analysis for the Detection of Parametric and Catastrophic Faults in Mixed-Signal Circuits. IEEE Trans. Instrum. Meas. 60(6): 2025-2038 (2011) - [j3]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
A Nondestructive Method for Accurately Extracting Substrate Parameters of Arbitrary Doping Profile in Nanoscale VLSI. IEEE Trans. Instrum. Meas. 60(9): 3173-3184 (2011) - [c14]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
A memetic algorithm for computing 3D capacitance in multiconductor VLSI circuits. DDECS 2011: 341-346 - [c13]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
Efficient inductance calculation for long and medium length rectangular interconnects in VLSI circuits. ISCAS 2011: 2337-2340 - [c12]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
Prospects of 3D inductors on through silicon vias processes for 3D ICs. VLSI-SoC 2011: 90-93 - 2010
- [j2]Michael G. Dimopoulos, Alexios Spyronasios, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alkis A. Hatzopoulos:
Circuit Implementation of a Supply Current Spectrum Test Method. IEEE Trans. Instrum. Meas. 59(10): 2660-2670 (2010) - [c11]Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos:
A GA-based method for efficient interconnect capacitance computation in mixed-signal integrated circuits using sets of linear charges. ICECS 2010: 962-965 - [c10]Michael G. Dimopoulos, Alexios Spyronasios, Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos:
Efficient testing of an optical feedback pixel driver using wavelet analysis. ICECS 2010: 1041-1044 - [c9]Michael G. Dimopoulos, Alexios Spyronasios, Alkis A. Hatzopoulos:
Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits. IOLTS 2010: 83-87 - [c8]Michael G. Dimopoulos, Dimitris K. Papakostas, Basilios D. Vassios, Alkis A. Hatzopoulos:
Wavelet analysis of current measurements for mixed-signal circuit testing. ISCAS 2010: 1923-1926 - [c7]Alexios Spyronasios, Michael G. Dimopoulos, Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos:
Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits Using Wavelets. ISVLSI 2010: 232-237
2000 – 2009
- 2008
- [c6]Dimitrios K. Konstantinou, Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Alexios Spyronasios:
Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach. DDECS 2008: 251-254 - [c5]Michael G. Dimopoulos, Dimitris K. Papakostas, Alexios Spyronasios, Alkis A. Hatzopoulos, Dimitrios K. Konstantinou:
Power supply current testing in the production line of emergency luminaire circuits. ICECS 2008: 778-781 - 2007
- [c4]Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Evdokimos I. Konstantinidis, Alexios Spyronasios:
Design and development of a versatile testing system for analog and mixed-signal circuits. ECCTD 2007: 846-849 - [c3]Michael G. Dimopoulos, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alexios Spyronasios, Alkis A. Hatzopoulos:
Multiple Parametric Circuit Analysis Tool for Detectability Estimation. ICECS 2007: 1111-1114 - 2004
- [b1]Michael G. Dimopoulos:
Μέθοδοι ελέγχου ολοκληρωμένων ψηφιακών κυκλωμάτων. Aristotle University Of Thessaloniki, Greece, 2004 - [c2]Michael G. Dimopoulos, Panagiotis Linardis:
Efficient Static Compaction of Test Sequence Sets through the Application of Set Covering Techniques. DATE 2004: 194-201 - 2003
- [j1]Michael G. Dimopoulos, Panagiotis Linardis:
Accelerating the compaction of test sequences in sequential circuits through problem size reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(10): 1443-1449 (2003) - 2002
- [c1]Michael G. Dimopoulos, Panagiotis Linardis:
Using Non-uniform Crossover in Genetic Algorithm Methods to Speed up the Generation of Test Patterns for Sequential Circuits. SETN 2002: 485-493
Coauthor Index
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