• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 67 matches

• 2014
• 
  Jacob A. Abraham, Xinli Gu, Teresa MacLaurin, Janusz Rajski, Paul G. Ryan, Dimitris Gizopoulos, Matteo Sonza Reorda:
  Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players? VTS 2014: 1-2
• 
  Mukesh Agrawal, Krishnendu Chakrabarty:
  Test-time optimization in NOC-based manycore SOCs using multicast routing. VTS 2014: 1-6
• 
  Abdulazim Amouri, Jochen Hepp, Mehdi Baradaran Tahoori:
  Self-heating thermal-aware testing of FPGAs. VTS 2014: 1-6
• 
  Abhishek Basak, Yu Zheng, Swarup Bhunia:
  Active defense against counterfeiting attacks through robust antifuse-based on-chip locks. VTS 2014: 1-6
• 
  Sounil Biswas, John M. Carulli, Dragoljub Gagi Drmanac, Arpan Bhattacherjee:
  Innovative practices session 5C: Machine learning and data analysis in test. VTS 2014: 1
• 
  Xiaolei Cai, Emil Gizdarski, Dan Landau:
  A shared memory based parallel diagnosis system. VTS 2014: 1-6
• 
  John M. Carulli:
  Special session 11B: ITRS adaptive test update. VTS 2014: 1
• 
  Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor:
  Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements. VTS 2014: 1-6
• 
  Doohwang Chang, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Engin Afacan, Günhan Dündar:
  Reliability enhancement using in-field monitoring and recovery for RF circuits. VTS 2014: 1-6
• 
  Jifeng Chen, LeRoy Winemberg, Mohammad Tehranipoor:
  Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests. VTS 2014: 1-6
• 
  C. J. Clark, Víctor H. Champac:
  Hot topic session 12B: Stay relevant with standards-based DFT. VTS 2014: 1
• 
  Dean Collins, Ramesh Karri:
  Hot topic session 12A: Split manufacturing - IARPA's TIC program. VTS 2014: 1-2
• 
  Atefe Dalirsani, Michael E. Imhof, Hans-Joachim Wunderlich:
  Structural Software-Based Self-Test of Network-on-Chip. VTS 2014: 1-6
• 
  Sabyasachi Deyati, Barry John Muldrey, Aritra Banerjee, Abhijit Chatterjee:
  Atomic model learning: A machine learning paradigm for post silicon debug of RF/analog circuits. VTS 2014: 1-6
• 
  Charutosh Dixit, Ramesh C. Tekumalla, Wei Zhao, Nilanjan Mukherjee, Vivek Chickermane:
  Innovative practices session 1C: Existing/emerging low power techniques. VTS 2014: 1
• 
  Jennifer Dworak:
  Special session 4A: Elevator talks. VTS 2014: 1
• 
  Allan Ecker, Mani Soma:
  A method for phase noise extraction from data communication. VTS 2014: 1-6
• 
  Yongquan Fan, Anant Verma, David S. Trager, Ramin K. Poorfard, John Janney, Sandeep Kumar:
  Accelerating capture of infrequent errors on ATE for silicon TV tuners. VTS 2014: 1-6
• 
  Anne Gattiker:
  Unstructured text: Test analysis techniques applied to non-test problems. VTS 2014: 1-4
• 
  Chao Han, Adit D. Singh:
  Improving CMOS open defect coverage using hazard activated tests. VTS 2014: 1-6
• 
  Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian:
  Fault modeling and test algorithm creation strategy for FinFET-based memories. VTS 2014: 1-6
• 
  Sen-Wen Hsiao, Chung-Chun Chen, Randy Caplan, Jeff Galloway, Blake Gray, Abhijit Chatterjee:
  Phase-locked loop design with SPO detection and charge pump trimming for reference spur suppression. VTS 2014: 1-6
• 
  Kai Hu, Tsung-Yi Ho, Krishnendu Chakrabarty:
  Test generation and design-for-testability for flow-based mVLSI microfluidic biochips. VTS 2014: 1-6
• 
  Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma, Terri S. Fiez, Mike Peng Li:
  Special session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test. VTS 2014: 1
• 
  Jae Woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao:
  Development and empirical verification of an accuracy model for the power down leakage tests. VTS 2014: 1-6
• 
  Manolis Kaliorakis, Mihalis Psarakis, Nikos Foutris, Dimitris Gizopoulos:
  Accelerated online error detection in many-core microprocessor architectures. VTS 2014: 1-6
• 
  Bozena Kaminska, Bernard Courtois, Chris Bailey:
  New topic session 2B: Co-design and reliability of power electronic modules - Current status and future challenges. VTS 2014: 1
• 
  Bozena Kaminska, Bernard Courtois, Mary Ann Maher:
  New topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensors. VTS 2014: 1
• 
  Sachhidh Kannan, Naghmeh Karimi, Ramesh Karri, Ozgur Sinanoglu:
  Detection, diagnosis, and repair of faults in memristor-based memories. VTS 2014: 1-6
• 
  Rohit Kapur, Irith Pomeranz:
  Innovative practices session 10C: Advances in DFT and compression. VTS 2014: 1

skipping 37 more matches