"Extraction of threshold voltage degradation modeling due to Negative Bias ..."

Soonyoung Cha et al. (2014)

> Home

Details and statistics

DOI: 10.1109/VTS.2014.6818769

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vts/ChaCLM14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vts/ChaCLM14
Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor:
Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements. VTS 2014: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.