default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDTaizhi Liu
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
Journal Articles
- 2022
[j13]Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
:
CacheEM: For Reliability Analysis on Cache Memory Aging Due to Electromigration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(9): 3078-3091 (2022)- 2021
- [j12]Rui Zhang, Kexin Yang, Zhaocheng Liu, Taizhi Liu, Wenshan Cai, Linda Milor:
A Comprehensive Framework for Analysis of Time-Dependent Performance-Reliability Degradation of SRAM Cache Memory. IEEE Trans. Very Large Scale Integr. Syst. 29(5): 857-870 (2021) - 2020
- [j11]Rui Zhang, Taizhi Liu, Kexin Yang, Chang-Chih Chen, Linda Milor:
SRAM Stability Analysis and Performance-Reliability Tradeoff for Different Cache Configurations. IEEE Trans. Very Large Scale Integr. Syst. 28(3): 620-633 (2020) - 2018
- [j10]Taizhi Liu, Chang-Chih Chen, Linda Milor:
Comprehensive Reliability-Aware Statistical Timing Analysis Using a Unified Gate-Delay Model for Microprocessors. IEEE Trans. Emerg. Top. Comput. 6(2): 219-232 (2018) - [j9]Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor:
A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology. IEEE Trans. Very Large Scale Integr. Syst. 26(11): 2470-2482 (2018) - 2017
- [j8]Kexin Yang, Taizhi Liu, Rui Zhang, Dae Hyun Kim, Linda Milor:
Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits. Microelectron. Reliab. 76-77: 81-86 (2017) - [j7]Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor:
Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations. Microelectron. Reliab. 76-77: 87-91 (2017) - [j6]Soonyoung Cha, Taizhi Liu, Linda Milor:
Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits With Die-to-Die Calibration Through Power Supply and Ground Signal Measurements. IEEE Trans. Very Large Scale Integr. Syst. 25(8): 2271-2284 (2017) - 2016
- [j5]Chang-Chih Chen, Taizhi Liu, Linda Milor:
System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection. IEEE Trans. Very Large Scale Integr. Syst. 24(8): 2712-2725 (2016) - 2015
- [j4]Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda S. Milor:
Processor-level reliability simulator for time-dependent gate dielectric breakdown. Microprocess. Microsystems 39(8): 950-960 (2015) - [j3]Taizhi Liu, Chang-Chih Chen, Woongrae Kim, Linda Milor:
Comprehensive reliability and aging analysis on SRAMs within microprocessor systems. Microelectron. Reliab. 55(9-10): 1290-1296 (2015) - [j2]Taizhi Liu, Chang-Chih Chen, Soonyoung Cha, Linda Milor:
System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown. Microelectron. Reliab. 55(9-10): 1334-1340 (2015) - [j1]Soonyoung Cha, Dae Hyun Kim, Taizhi Liu, Linda S. Milor:
The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system. Microelectron. Reliab. 55(9-10): 1404-1411 (2015)
Conference and Workshop Papers
- 2020
- [c10]Rui Zhang, Zhaocheng Liu, Kexin Yang, Taizhi Liu, Wenshan Cai, Linda Milor:
Inverse Design of FinFET SRAM Cells. IRPS 2020: 1-6 - 2019
- [c9]Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor:
Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor. IWASI 2019: 258-263 - 2018
- [c8]Kexin Yang, Rui Zhang, Taizhi Liu, Dae Hyun Kim, Linda Milor:
Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology. DCIS 2018: 1-6 - [c7]Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor:
Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms. DCIS 2018: 1-6 - [c6]Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor:
Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology. VTS 2018: 1-6 - 2017
- [c5]Woongrae Kim, Taizhi Liu, Linda Milor:
On-line monitoring of system health using on-chip SRAMs as a wearout sensor. IOLTS 2017: 253-258 - 2016
- [c4]Taizhi Liu, Chang-Chih Chen, Jiadong Wu, Linda S. Milor:
SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection. ICCD 2016: 225-232 - 2015
- [c3]Taizhi Liu, Chang-Chih Chen, Linda S. Milor:
Accurate standard cell characterization and statistical timing analysis using multivariate adaptive regression splines. ISQED 2015: 272-279 - [c2]Woongrae Kim, Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda Milor:
Estimation of remaining life using embedded SRAM for wearout parameter extraction. IWASI 2015: 243-248 - 2014
- [c1]Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor:
Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements. VTS 2014: 1-6
Coauthor Index
aka: Linda Milor
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-24 23:15 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
