"Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in ..."

Soonyoung Cha, Taizhi Liu, Linda Milor (2017)

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DOI: 10.1109/TVLSI.2017.2683261

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/ChaLM17
Soonyoung Cha, Taizhi Liu, Linda Milor:
Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits With Die-to-Die Calibration Through Power Supply and Ground Signal Measurements. IEEE Trans. Very Large Scale Integr. Syst. 25(8): 2271-2284 (2017)

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