"System-Level Modeling of Microprocessor Reliability Degradation Due to ..."

Chang-Chih Chen, Taizhi Liu, Linda Milor (2016)

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DOI: 10.1109/TVLSI.2016.2520658

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type: Journal Article

metadata version: 2022-01-03

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Chang-Chih Chen, Taizhi Liu, Linda Milor:
System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection. IEEE Trans. Very Large Scale Integr. Syst. 24(8): 2712-2725 (2016)

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