"A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for ..."

Kexin Yang et al. (2018)

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DOI: 10.1109/TVLSI.2018.2861769

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type: Journal Article

metadata version: 2021-09-01

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Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor:
A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology. IEEE Trans. Very Large Scale Integr. Syst. 26(11): 2470-2482 (2018)

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