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ORCIDGurgen Harutunyan
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Journal Articles
- 2024
[j6]Mahta Mayahinia
, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Karen Amirkhanyan, Artur Ghukasyan, Gurgen Harutyunyan, Yervant Zorian:
Testing for Electromigration in Sub-5-nm FinFET Memories. IEEE Des. Test 41(6): 54-61 (2024)- 2020
- [j5]Gurgen Harutyunyan, Suren Martirosyan, Samvel K. Shoukourian, Yervant Zorian:
Memory Physical Aware Multi-Level Fault Diagnosis Flow. IEEE Trans. Emerg. Top. Comput. 8(3): 700-711 (2020) - 2019
- [j4]Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(3): 562-575 (2019) - 2012
- [j3]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(6): 941-949 (2012) - 2011
- [j2]Gurgen Harutunyan, Aram Hakhumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Symmetry Measure for Memory Test and Its Application in BIST Optimization. J. Electron. Test. 27(6): 753-766 (2011) - 2007
- [j1]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
Minimal March Tests for Detection of Dynamic Faults in Random Access Memories. J. Electron. Test. 23(1): 55-74 (2007)
Conference and Workshop Papers
- 2024
- [c50]Fabian Vargas, Vache Galstyan, Gurgen Harutyunyan, Yervant Zorian:
On-Chip Sensor to Monitor Aging Evolution in FinFET-Based Memories. IOLTS 2024: 1-6 - [c49]Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects. ITC 2024: 46-50 - [c48]Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. VTS 2024: 1-5 - 2023
- [c47]Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI. ETS 2023: 1-4 - [c46]Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
Utilizing ECC Analytics to Improve Memory Lifecycle Management. ITC 2023: 383-387 - [c45]Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor. ITC 2023: 388-392 - [c44]Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. VTS 2023: 1-4 - [c43]Keqing Ouyang, Minqiang Peng, Yunnong Zhu, Kang Qi, Grigor Tshagharyan, Arun Kumar, Gurgen Harutyunyan, Isaac Wang:
An Efficient External Memory Test Solution: Case Study for HPC Application. VTS 2023: 1-4 - 2022
- [c42]Costas Argyrides, Vilas Sridharan, Hayk Danoyan, Gurgen Harutyunyan, Yervant Zorian:
A Novel Protection Technique for Embedded Memories with Optimized PPA. ITC 2022: 642-645 - [c41]Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan:
An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. ITC 2022: 650-655 - [c40]Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee:
Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety. VTS 2022: 1 - 2020
- [c39]Gabriele Boschi, Elisa Spano, Hayk T. Grigoryan, Arun Kumar, Gurgen Harutyunyan:
Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications. ITC 2020: 1-6 - [c38]M. Casarsa, Gurgen Harutyunyan, Yervant Zorian:
Test and Diagnosis Solution for Functional Safety. ITC 2020: 1-5 - 2019
- [c37]Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Memory FIT Rate Mitigation Technique for Automotive SoCs. ITC 2019: 1-6 - [c36]S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan:
Innovative Practices on In-System Test and Reliability of Memories. VTS 2019: 1 - 2018
- [c35]M. Casarsa, Gurgen Harutyunyan:
Case Study and Advanced Functional Safety Solution for Automotive SoCs. ITC 2018: 1-8 - [c34]Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides:
Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs. ITC 2018: 1-6 - [c33]Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, N. Martirosyan, Yervant Zorian:
Advanced Uniformed Test Approach For Automotive SoCs. ITC 2018: 1-10 - [c32]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian:
Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. ITC 2018: 1-10 - [c31]Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. ITC 2018: 1-10 - [c30]M. Casarsa, Gurgen Harutyunyan, Kaitlyn Chen, Ramesh Sharma, Giri Podichetty, Martin Keim, Sreejit Chakravarty, Ramesh C. Tekumalla:
Innovative practices on memory test practice. VTS 2018: 1 - 2017
- [c29]Suren Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
An efficient testing methodology for embedded flash memories. EWDTS 2017: 1-4 - [c28]D. Sargsyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Automated flow for test pattern creation for IPs in SoC. EWDTS 2017: 1-4 - [c27]Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Experimental study on Hamming and Hsiao codes in the context of embedded applications. EWDTS 2017: 1-4 - [c26]Hanna Shaheen, Gabriele Boschi, Gurgen Harutyunyan, Yervant Zorian:
Advanced ECC solution for automotive SoCs. IOLTS 2017: 71-73 - [c25]Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, I. Kroul, Hanna Shaheen, Yervant Zorian:
Advanced functional safety mechanisms for embedded memories and IPs in automotive SoCs. ITC 2017: 1-6 - [c24]Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
An effective functional safety solution for automotive systems-on-chip. ITC 2017: 1-10 - 2016
- [c23]Gurgen Harutyunyan:
Extending fault periodicity table for testing external memory faults. EWDTS 2016: 1-4 - [c22]Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Securing test infrastructure of system-on-chips. EWDTS 2016: 1-4 - 2015
- [c21]L. Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
A power based memory BIST grouping methodology. EWDTS 2015: 1-4 - [c20]Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Overview study on fault modeling and test methodology development for FinFET-based memories. EWDTS 2015: 1-4 - [c19]Gurgen Harutunyan, Yervant Zorian:
An effective embedded test & diagnosis solution for external memories. IOLTS 2015: 168-170 - [c18]Gurgen Harutyunyan, Grigor Tshagharyan, Yervant Zorian:
Impact of parameter variations on FinFET faults. VTS 2015: 1-4 - 2014
- [c17]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Extending fault periodicity table for testing faults in memories under 20nm. EWDTS 2014: 1-4 - [c16]Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian:
Fault modeling and test algorithm creation strategy for FinFET-based memories. VTS 2014: 1-6 - 2013
- [c15]K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Application of defect injection flow for fault validation in memories. EWDTS 2013: 1-4 - [c14]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Impact of process variations on read failures in SRAMs. EWDTS 2013: 1-4 - [c13]T. Melkumyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters. EWDTS 2013: 1-4 - [c12]W. Prates, Letícia Maria Veiras Bolzani, Gurgen Harutyunyan, A. Davtyan, Fabian Vargas, Yervant Zorian:
Integrating embedded test infrastructure in SRAM cores to detect aging. IOLTS 2013: 25-30 - [c11]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
An effective solution for building memory BIST infrastructure based on fault periodicity. VTS 2013: 1-6 - 2011
- [c10]K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A Robust Solution for Embedded Memory Test and Repair. Asian Test Symposium 2011: 461-462 - [c9]Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Generic BIST architecture for testing of content addressable memories. IOLTS 2011: 86-91 - 2010
- [c8]H. Avetisyan, Gurgen Harutyunyan, Valery A. Vardanian, Yervant Zorian:
An efficient March test for detection of all two-operation dynamic faults from subclass Sav. EWDTS 2010: 310-313 - 2008
- [c7]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories. VTS 2008: 95-100 - 2007
- [c6]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
A March-based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories. DDECS 2007: 145-148 - 2006
- [c5]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
Minimal March-Based Fault Location Algorithm with Partial Diagnosis for all Static Faults in Random Access Memories. DDECS 2006: 262-267 - [c4]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
Minimal March Tests for Dynamic Faults in Random Access Memories. ETS 2006: 43-48 - [c3]T. A. Gyonjyan, Gurgen Harutunyan, Valery A. Vardanian:
A March-Based Algorithm for Location and Full Diagnosis of All Unlinked Static Faults. MTDT 2006: 9-14 - [c2]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories. VTS 2006: 120-127 - 2005
- [c1]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
Minimal March Tests for Unlinked Static Faults in Random Access Memories. VTS 2005: 53-59
Coauthor Index
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