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ORCID30th IOLTS 2024: Rennes, France
- 30th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2024, Rennes, France, July 3-5, 2024. IEEE 2024, ISBN 979-8-3503-7055-3
- Adrià Aldomà, Axel Brando, Francisco J. Cazorla, Jaume Abella:
Safety-Relevant AI-Based System Robustification with Neural Network Ensembles. 1-3 - Zhe Zhang, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif:
Do Radiation and Aging Impact DVFS? TCAD-based Analysis on 22 nm FDSOI Latches. 1-6 - Nicola Scarano, Luca Mannella, Alessandro Savino, Stefano Di Carlo, Politecnico Di Torino:
Can social media shape the security of next-generation connected vehicles? 1-4 - Anil Bayram Gögebakan, Enrico Magliano, Alessio Carpegna, Annachiara Ruospo, Alessandro Savino, Stefano Di Carlo:
SpikingJET: Enhancing Fault Injection for Fully and Convolutional Spiking Neural Networks. 1-7 - Anudeep Dharavathu, Benjamin Tan:
Investigating the Feasibility of eFPGA-based Hardware Patching. 1-7 - Francesco Tosoni, Nicola Dall'Ora, Enrico Fraccaroli, Sara Vinco, Franco Fummi:
Assessing Robustness of Smart Systems via Multi-domain Analog Fault Simulation. 1-3 - Bruno Forlin, Edian B. Annink, Elijah Cishugi, Carlo Cazzaniga, Paolo Rech, Gerard K. Rauwerda, Gianluca Furano, Marco Ottavi:
Neutron Beam Evaluation of Probabilistic Data Structure-based Online Checkers. 1-6 - Kenrick Xavier Pinto, Krishnaja Kodali, Abhishek Das, Nur A. Touba:
Double Adjacent Error Correction in RRAM Matrix Multiplication using Weighted Checksums. 1-5 - Anton Maidl, Maël Gay, Osnat Keren, Ilia Polian:
Refinement and Empirical Side-Channel Analysis of Inner Product Masking with Robust Error Detection. 1-7 - Brojogopal Sapui, Sergej Meschkov, Mehdi B. Tahoori:
Side-Channel Attack with Fault Analysis on Memristor-based Computation-in-Memory. 1-7 - Diamante Simone Crescenzo, Rafael Carrera Rodriguez, Riccardo Alidori, Florent Bruguier, Emanuele Valea, Pascal Benoit, Alberto Bosio:
Hardware Accelerator for FIPS 202 Hash Functions in Post-Quantum Ready SoCs. 1-6 - Franco Oberti, Fabrizio Abrate, Alessandro Savino, Filippo Parisi, Stefano Di Carlo:
Navigating the road to automotive cybersecurity compliance. 1-4 - Mohammad Hasan Ahmadilivani, Seyedhamidreza Mousavi, Jaan Raik, Masoud Daneshtalab, Maksim Jenihhin:
Cost-Effective Fault Tolerance for CNNs Using Parameter Vulnerability Based Hardening and Pruning. 1-7 - Papavramidou Panagiota, Sebastien Ricavy, Christopher Mounet, Carine Jahan, Niccolo Castellani, François Andrieu:
A synergistic fault tolerance framework for Mbit 28nm embedded RRAM. 1-7 - Mahya Morid Ahmadi, Lilas Alrahis, Ozgur Sinanoglu, Muhammad Shafique:
Camo-DNN: Layer Camouflaging to Protect DNNs against Timing Side-Channel Attacks. 1-7 - Thiago Macieira, Sankar Gurumurthy, Sudhanva Gurumurthi, Amr Haggag, George Papadimitriou, Dimitris Gizopoulos:
Silent Data Corruptions in Computing: Understand and Quantify. 1-7 - Martin Omaña, A. Manfredi, Cecilia Metra, R. Locatelli, M. Chiavacci, S. Petrucci:
Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessors' Caches. 1-6 - Anurup Saha, Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee:
Efficient Optimized Testing of Resistive RAM Based Convolutional Neural Networks. 1-7 - V. Mahboubi, Á. Gómez, Antonio Calomarde, Daniel Arumí, R. Rodríguez, Salvador Manich:
On the Fine Tuning of RRAM Resistance Under Variability Using Current Pulses at SET. 1-7 - Fabian Vargas, Vache Galstyan, Gurgen Harutyunyan, Yervant Zorian:
On-Chip Sensor to Monitor Aging Evolution in FinFET-Based Memories. 1-6 - Ihab Alshaer, Ahmed Al-Kaf, Valentin Egloff, Vincent Beroulle:
Modeling Clock Glitch Fault Injection Effects on a RISC-V Microcontroller. 1-3 - Ryusei Eda, Kota Hisafuru, Nozomu Togawa:
Anomalous IoT Behavior Detection by Generated Power Waveforms with Hyper-parameter Tuning. 1-3 - Ivan Rodriguez-Ferrandez, Leonidas Kosmidis, Maris Tali, David Steenari, Alex Hands, Camille Bélanger-Champagne:
Proton Evaluation of Single Event Effects in the NVIDIA GPU Orin SoM: Understanding Radiation Vulnerabilities Beyond the SoC. 1-7 - Fernando Fernandes dos Santos, Marcello Traiola, Angeliki Kritikakou:
Combining Fault Simulation and Beam Data for CNN Error Rate Estimation on RISC-V Commercial Platforms. 1-8 - Giuseppe Esposito, Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Marco Levorato, Matteo Sonza Reorda:
Enhancing the Reliability of Split Computing Deep Neural Networks. 1-7 - Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage:
EM Fault Injection-Induced Clock Glitches: From Mechanism Analysis to Novel Sensor Design. 1-7 - Alessio Colucci, Andreas Steininger, Muhammad Shafique:
SBanTEM: A Novel Methodology for Sparse Band Tensors as Soft-Error Mitigation in Sparse Convolutional Neural Networks. 1-3 - Gaurav Kumar, Anjum Riaz, Pardeep Kumar, Yamuna Prasad, Satyadev Ahlawat:
On Evaluating Test Response Obfuscation and Encryption Countermeasures. 1-3 - Alecsandra Rusu, Emilian David, Marina Dana Topa, Vasile Grosu, Andi Buzo, Georg Pelz:
On Approaching Multivariate IC Pre-silicon Verification Using ML-based Adaptive Algorithms. 1-3 - Wilfread Guillemé, Angeliki Kritikakou, Youri Helen, Cédric Killian, Daniel Chillet:
VANDOR: Mitigating SEUs into Quantized Neural Networks. 1-6 - Francesco Pessia, Juan-David Guerrero-Balaguera, Robert Limas Sierra, Josie E. Rodriguez Condia, Marco Levorato, Matteo Sonza Reorda:
Effective Application-level Error Modeling of Permanent Faults on AI Accelerators. 1-7 - Hossein Rostami, Mostafa Hosseini, Ali Azarpeyvand, Mohammad Reza Heidari Iman, Tara Ghasempouri:
Automatic High Functional Coverage Stimuli Generation for Assertion-based Verification. 1-7 - G. Mongelli, Xhesila Xhafa, Eric Faehn, D. Robins, P. Girard, Arnaud Virazel:
A Graph-Based Methodology for Speeding up Cell-Aware Model Generation. 1-6 - Alessio Colucci, Andreas Steininger, Muhammad Shafique:
EISFINN: On the Role of Efficient Importance Sampling in Fault Injection Campaigns for Neural Network Robustness Analysis. 1-3 - Behnam Ghavami, Mohammad Shahidzadeh, Lesley Shannon, Steve Wilton:
ZOBNN: Zero-Overhead Dependable Design of Binary Neural Networks with Deliberately Quantized Parameters. 1-7 - M. Zhupa, M. Naldi, Maira Omaña, Cecilia Metra:
On the Reliability of Clock Monitoring Units for Safety Critical Applications' Microcontrollers. 1-3 - Michelangelo Bartolomucci, Nikolaos Ioannis Deligiannis, Riccardo Cantoro, Matteo Sonza Reorda:
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects. 1-6 - Sara Cretí, Martin Omaña, Cecilia Metra, Gianni Borelli:
Reliability of AI in Predicting the State of Health of Li-Ion Batteries*. 1-7
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