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2020 – today
- 2024
[j29]Suhee Sanjana Mehjabin
, Mohamed F. Younis, Ali Tekeoglu, Mohammad Ebrahimabadi, Tamim Sookoor, Naghmeh Karimi:
PETIT: PUF-enabled trust evaluation framework for IoT networks. Comput. Networks 254: 110772 (2024)- [j28]Naghmeh Karimi:
The 28th IEEE European Test Symposium. IEEE Des. Test 41(1): 91-92 (2024) - [j27]Mohammad Ebrahimabadi, Suhee Sanjana Mehjabin, Raphael Viera, Sylvain Guilley, Jean-Luc Danger, Jean-Max Dutertre, Naghmeh Karimi:
DELFINES: Detecting Laser Fault Injection Attacks via Digital Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(3): 774-787 (2024) - [j26]Md Toufiq Hasan Anik, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
On the Resiliency of Protected Masked S-Boxes Against Template Attack in the Presence of Temperature and Aging Misalignments. IEEE Trans. Very Large Scale Integr. Syst. 32(5): 911-924 (2024) - [c65]Mohammad Ebrahimabadi, Javad Bahrami, Mohamed Younis, Naghmeh Karimi:
Digital Twin Integrity Protection in Distributed Control Systems. CCNC 2024: 540-545 - [c64]Javad Bahrami, Mohammad Ebrahimabadi, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi:
Impact of Process Mismatch and Device Aging on SR-Latch Based True Random Number Generators. COSADE 2024: 177-196 - [c63]Sofiane Takarabt, Javad Bahrami, Mohammad Ebrahimabadi, Sylvain Guilley, Naghmeh Karimi:
Securing ISW Masking Scheme Against Glitches. DATE 2024: 1-2 - [c62]Javad Bahrami, Mohammad Ebrahimabadi, Mohamed F. Younis, Naghmeh Karimi:
Digital Twin Based Topology Fingerprinting for Detecting False Data Injection Attacks in Cyber-Physical Systems. ICC 2024: 2053-2058 - [c61]Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Attacking Multi-Tenant FPGAs Without Manual Placement and Routing. ISVLSI 2024: 367-372 - [c60]Hossein Pourmehrani, Javad Bahrami, Parsa Nooralinejad, Hamed Pirsiavash, Naghmeh Karimi:
FAT-RABBIT: Fault-Aware Training towards Robustness AgainstBit-flip Based Attacks in Deep Neural Networks. ITC 2024: 106-110 - 2023
- [j25]Suhee Sanjana Mehjabin, Ali Tekeoglu, Mohamed F. Younis, Mohammad Ebrahimabadi, Rahul Chandran, Tamim Sookoor, Naghmeh Karimi:
A Networked System Dependability Validation Framework Using Physical and Virtual Nodes. IEEE Access 11: 127242-127254 (2023) - [j24]Naghmeh Karimi:
The 41st IEEE VLSI Test Symposium. IEEE Des. Test 40(5): 113-114 (2023) - [c59]Farshad Firouzi, Krishnendu Chakrabarty, Naghmeh Karimi, Bahareh J. Farahani, Diana Goehringer, Aurora Gil de Castro, Marc Reichenbach, Kun-Chih Chen:
Welcome Message from the Chairs. COINS 2023: 1 - [c58]Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Aging-Induced Failure Prognosis via Digital Sensors. ACM Great Lakes Symposium on VLSI 2023: 703-708 - [c57]Sofiane Takarabt, Javad Bahrami, Mohammad Ebrahimabadi, Sylvain Guilley, Naghmeh Karimi:
Security Order of Gate-Level Masking Schemes. HOST 2023: 57-67 - [c56]Javad Bahrami, Jean-Luc Danger, Mohammad Ebrahimabadi, Sylvain Guilley, Naghmeh Karimi:
Challenges in Generating True Random Numbers Considering the Variety of Corners, Aging, and Intentional Attacks. ICICDT 2023: 10-15 - [c55]Satoshi Kai, Takao Kondo, Naghmeh Karimi, Konstantinos Mersinas, Marc Sel, Roberto Yus, Satoru Tezuka:
International Mutual Recognition: A Description of Trust Services in US, UK, EU and JP and the Testbed "Hakoniwa". SECRYPT 2023: 764-771 - [c54]Javad Bahrami, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Special Session: Security Verification & Testing for SR-Latch TRNGs. VTS 2023: 1-10 - 2022
- [j23]Trevor Kroeger, Wei Cheng, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs. J. Electron. Test. 38(3): 261-277 (2022) - [j22]Mohammad Ebrahimabadi, Mohamed F. Younis, Naghmeh Karimi:
A PUF-Based Modeling-Attack Resilient Authentication Protocol for IoT Devices. IEEE Internet Things J. 9(5): 3684-3703 (2022) - [j21]Wassila Lalouani, Mohamed F. Younis, Mohammad Ebrahimabadi, Naghmeh Karimi:
Countering Modeling Attacks in PUF-based IoT Security Solutions. ACM J. Emerg. Technol. Comput. Syst. 18(3): 46:1-46:28 (2022) - [j20]Farzad Niknia, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Aging Effects on Template Attacks Launched on Dual-Rail Protected Chips. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(5): 1276-1289 (2022) - [j19]Trevor Kroeger, Wei Cheng, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi:
Assessment and Mitigation of Power Side-Channel-Based Cross-PUF Attacks on Arbiter-PUFs and Their Derivatives. IEEE Trans. Very Large Scale Integr. Syst. 30(2): 187-200 (2022) - [c53]Wassila Lalouani, Mohamed F. Younis, Mohammad Ebrahimabadi, Naghmeh Karimi:
Robust and Efficient Data Security Solution for Pervasive Data Sharing in IoT. CCNC 2022: 775-781 - [c52]Javad Bahrami, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Leakage Power Analysis in Different S-Box Masking Protection Schemes. DATE 2022: 1263-1268 - [c51]Wassila Lalouani, Mohamed Younis, Mohammad Ebrahimabadi, Naghmeh Karimi:
Collusion-resistant PUF-based Distributed Device Authentication Protocol for Internet of Things. GLOBECOM 2022: 4328-4333 - [c50]Mohammad Ebrahimabadi, Mohamed F. Younis, Wassila Lalouani, Abdulaziz Alshaeri, Naghmeh Karimi:
SWeeT: Security Protocol for Wearables Embedded Devices' Data Transmission. HealthCom 2022: 135-141 - [c49]Mohammad Ebrahimabadi, Suhee Sanjana Mehjabin, Raphael Viera, Sylvain Guilley, Jean-Luc Danger, Jean-Max Dutertre, Naghmeh Karimi:
Detecting Laser Fault Injection Attacks via Time-to-Digital Converter Sensors. HOST 2022: 97-100 - [c48]Mohammad Ebrahimabadi, Bijan Fadaeinia, Amir Moradi, Naghmeh Karimi:
Does Aging Matter? The Curious Case of Fault Sensitivity Analysis. ISQED 2022: 84-89 - [c47]Javad Bahrami, Mohammad Ebrahimabadi, Sofiane Takarabt, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
On the Practicality of Relying on Simulations in Different Abstraction Levels for Pre-silicon Side-Channel Analysis. SECRYPT 2022: 661-668 - [c46]Mohammad Ebrahimabadi, Mohamed F. Younis, Wassila Lalouani, Naghmeh Karimi:
An Attack Resilient PUF-based Authentication Mechanism for Distributed Systems. VLSID 2022: 108-113 - [c45]Mehdi Sadi, Yi He, Yanjing Li, Mahabubul Alam, Satwik Kundu, Swaroop Ghosh, Javad Bahrami, Naghmeh Karimi:
Special Session: On the Reliability of Conventional and Quantum Neural Network Hardware. VTS 2022: 1-12 - [i5]Mohammad Ebrahimabadi, Mohamed F. Younis, Wassila Lalouani, Naghmeh Karimi:
An Attack Resilient PUF-based Authentication Mechanism for Distributed Systems. CoRR abs/2206.07019 (2022) - 2021
- [j18]Bijan Fadaeinia, Md Toufiq Hasan Anik, Naghmeh Karimi, Amir Moradi:
Masked SABL: A Long Lasting Side-Channel Protection Design Methodology. IEEE Access 9: 90455-90464 (2021) - [j17]Ashkan Vakil, Ali Mirzaeian, Houman Homayoun, Naghmeh Karimi, Avesta Sasan:
AVATAR: NN-Assisted Variation Aware Timing Analysis and Reporting for Hardware Trojan Detection. IEEE Access 9: 92881-92900 (2021) - [j16]Naghmeh Karimi, Kanad Basu, Chip-Hong Chang, Jason M. Fung:
Hardware Security in Emerging Technologies: Vulnerabilities, Attacks, and Solutions. IEEE J. Emerg. Sel. Topics Circuits Syst. 11(2): 223-227 (2021) - [j15]Wenye Liu, Chip-Hong Chang, Xueyang Wang, Chen Liu, Jason M. Fung, Mohammad Ebrahimabadi, Naghmeh Karimi, Xingyu Meng, Kanad Basu:
Two Sides of the Same Coin: Boons and Banes of Machine Learning in Hardware Security. IEEE J. Emerg. Sel. Topics Circuits Syst. 11(2): 228-251 (2021) - [j14]Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Reducing Aging Impacts in Digital Sensors via Run-Time Calibration. J. Electron. Test. 37(5): 653-673 (2021) - [j13]Md Toufiq Hasan Anik, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Detecting Failures and Attacks via Digital Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(7): 1315-1326 (2021) - [c44]Md Toufiq Hasan Anik, Bijan Fadaeinia, Amir Moradi, Naghmeh Karimi:
On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits. ASP-DAC 2021: 414-420 - [c43]Ashkan Vakil, Farzad Niknia, Ali Mirzaeian, Avesta Sasan, Naghmeh Karimi:
Learning Assisted Side Channel Delay Test for Detection of Recycled ICs. ASP-DAC 2021: 455-462 - [c42]Trevor Kroeger, Wei Cheng, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi:
Enhancing the Resiliency of Multi-bit Parallel Arbiter-PUF and Its Derivatives Against Power Attacks. COSADE 2021: 303-321 - [c41]Trevor Kroeger, Wei Cheng, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi:
Making Obfuscated PUFs Secure Against Power Side-Channel Based Modeling Attacks. DATE 2021: 1000-1005 - [c40]Md Toufiq Hasan Anik, Jean-Luc Danger, Omar Diankha, Mohammad Ebrahimabadi, Christoph Frisch, Sylvain Guilley, Naghmeh Karimi, Michael Pehl, Sofiane Takarabt:
Testing and Reliability Enhancement of Security Primitives. DFT 2021: 1-8 - [c39]Mohammad Ebrahimabadi, Mohamed F. Younis, Naghmeh Karimi:
Hardware Assisted Smart Grid Authentication. ICC 2021: 1-6 - [c38]Ke Huang, Md Toufiq Hasan Anik, Xinqiao Zhang, Naghmeh Karimi:
Real-Time IC Aging Prediction via On-Chip Sensors. ISVLSI 2021: 13-18 - [c37]Mohammad Ebrahimabadi, Wassila Lalouani, Mohamed F. Younis, Naghmeh Karimi:
Countering PUF Modeling Attacks through Adversarial Machine Learning. ISVLSI 2021: 356-361 - [c36]Mohammad Ebrahimabadi, Mohamed F. Younis, Wassila Lalouani, Naghmeh Karimi:
A Novel Modeling-Attack Resilient Arbiter-PUF Design. VLSID 2021: 123-128 - 2020
- [c35]Trevor Kroeger, Wei Cheng, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi:
Effect of Aging on PUF Modeling Attacks based on Power Side-Channel Observations. DATE 2020: 454-459 - [c34]Amir Alipour, Vincent Beroulle, Bertrand Cambou, Jean-Luc Danger, Giorgio Di Natale, David Hély, Sylvain Guilley, Naghmeh Karimi:
PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community. ETS 2020: 1-10 - [c33]Md Toufiq Hasan Anik, Rachit Saini, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Failure and Attack Detection by Digital Sensors. ETS 2020: 1-2 - [c32]Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Hamed Pirsiavash, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability. ICCD 2020: 506-509 - [c31]Ashkan Vakil, Farnaz Behnia, Ali Mirzaeian, Houman Homayoun, Naghmeh Karimi, Avesta Sasan:
LASCA: Learning Assisted Side Channel Delay Analysis for Hardware Trojan Detection. ISQED 2020: 40-45 - [c30]Trevor Kroeger, Wei Cheng, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi:
Cross-PUF Attacks on Arbiter-PUFs through their Power Side-Channel. ITC 2020: 1-5 - [c29]Md Toufiq Hasan Anik, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi:
On the Effect of Aging on Digital Sensors. VLSID 2020: 189-194 - [c28]Shervin Roshanisefat, Hadi Mardani Kamali, Kimia Zamiri Azar, Sai Manoj Pudukotai Dinakarrao, Naghmeh Karimi, Houman Homayoun, Avesta Sasan:
DFSSD: Deep Faults and Shallow State Duality, A Provably Strong Obfuscation Solution for Circuits with Restricted Access to Scan Chain. VTS 2020: 1-6 - [i4]Ashkan Vakil, Farnaz Behnia, Ali Mirzaeian, Houman Homayoun, Naghmeh Karimi, Avesta Sasan:
LASCA: Learning Assisted Side Channel Delay Analysis for Hardware Trojan Detection. CoRR abs/2001.06476 (2020) - [i3]Shervin Roshanisefat, Hadi Mardani Kamali, Kimia Zamiri Azar, Sai Manoj Pudukotai Dinakarrao, Naghmeh Karimi, Houman Homayoun, Avesta Sasan:
DFSSD: Deep Faults and Shallow State Duality, A Provably Strong Obfuscation Solution for Circuits with Restricted Access to Scan Chain. CoRR abs/2002.07857 (2020) - [i2]Ashkan Vakil, Farzad Niknia, Ali Mirzaeian, Avesta Sasan, Naghmeh Karimi:
Learning Assisted Side Channel Delay Test for Detection of Recycled ICs. CoRR abs/2010.12704 (2020)
2010 – 2019
- 2019
- [j12]James Shey, Naghmeh Karimi, Ryan W. Robucci, Chintan Patel:
Implementation-Based Design Fingerprinting for Robust IC Fraud Detection. J. Hardw. Syst. Secur. 3(4): 426-439 (2019) - [j11]Naghmeh Karimi, Thorben Moos, Amir Moradi:
Exploring the Effect of Device Aging on Static Power Analysis Attacks. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2019(3): 233-256 (2019) - [j10]Ke Huang, Xinqiao Zhang, Naghmeh Karimi:
Real-Time Prediction for IC Aging Based on Machine Learning. IEEE Trans. Instrum. Meas. 68(12): 4756-4764 (2019) - [c27]Hassan Salmani, Tamzidul Hoque, Swarup Bhunia, Muhammad Yasin, Jeyavijayan (JV) Rajendran, Naghmeh Karimi:
Special Session: Countering IP Security threats in Supply chain. VTS 2019: 1-9 - 2018
- [j9]Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley:
Impact of Aging on the Reliability of Delay PUFs. J. Electron. Test. 34(5): 571-586 (2018) - [c26]Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi:
Device aging: A reliability and security concern. ETS 2018: 1-10 - [c25]Naghmeh Karimi, Sylvain Guilley, Jean-Luc Danger:
Impact of Aging on Template Attacks. ACM Great Lakes Symposium on VLSI 2018: 455-458 - [c24]Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley:
On the Effect of Aging in Detecting Hardware Trojan Horses with Template Analysis. IOLTS 2018: 281-286 - [c23]James Shey, Naghmeh Karimi, Ryan W. Robucci, Chintan Patel:
Design-Based Fingerprinting Using Side-Channel Power Analysis for Protection Against IC Piracy. ISVLSI 2018: 614-619 - [c22]Ro Cammarota, Naghmeh Karimi, Siddharth Garg, Jeyavijayan Rajendran:
Special session: Recent developments in hardware security. VTS 2018: 1 - 2017
- [c21]Naghmeh Karimi, Jean-Luc Danger, Mariem Slimani, Sylvain Guilley:
Impact of the switching activity on the aging of delay-PUFs. ETS 2017: 1-2 - [i1]Naghmeh Karimi, Jean-Luc Danger, Florent Lozach, Sylvain Guilley:
Predictive Aging of Reliability of two Delay PUFs. IACR Cryptol. ePrint Arch. 2017: 347 (2017) - 2016
- [c20]Naghmeh Karimi, Ke Huang:
Prognosis of NBTI aging using a machine learning scheme. DFT 2016: 7-10 - [c19]Naghmeh Karimi, Jean-Luc Danger, Florent Lozach, Sylvain Guilley:
Predictive Aging of Reliability of Two Delay PUFs. SPACE 2016: 213-232 - 2015
- [j8]Naghmeh Karimi, Arun Karthik Kanuparthi, Xueyang Wang, Ozgur Sinanoglu, Ramesh Karri:
MAGIC: Malicious Aging in Circuits/Cores. ACM Trans. Archit. Code Optim. 12(1): 5:1-5:25 (2015) - [j7]Sachhidh Kannan, Naghmeh Karimi, Ozgur Sinanoglu, Ramesh Karri:
Security Vulnerabilities of Emerging Nonvolatile Main Memories and Countermeasures. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(1): 2-15 (2015) - [j6]Sachhidh Kannan, Naghmeh Karimi, Ramesh Karri, Ozgur Sinanoglu:
Modeling, Detection, and Diagnosis of Faults in Multilevel Memristor Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(5): 822-834 (2015) - [c18]Xiaofei Guo, Naghmeh Karimi, Francesco Regazzoni, Chenglu Jin, Ramesh Karri:
Simulation and analysis of negative-bias temperature instability aging on power analysis attacks. HOST 2015: 124-129 - [c17]Alexander DeTrano, Sylvain Guilley, Xiaofei Guo, Naghmeh Karimi, Ramesh Karri:
Exploiting small leakages in masks to turn a second-order attack into a first-order attack. HASP@ISCA 2015: 7:1-7:5 - 2014
- [c16]Sachhidh Kannan, Naghmeh Karimi, Ozgur Sinanoglu:
Secure Memristor-based Main Memory. DAC 2014: 178:1-178:6 - [c15]Sachhidh Kannan, Naghmeh Karimi, Ramesh Karri, Ozgur Sinanoglu:
Detection, diagnosis, and repair of faults in memristor-based memories. VTS 2014: 1-6 - 2013
- [j5]Naghmeh Karimi, Michail Maniatakos, Chandrasekharan Tirumurti, Yiorgos Makris:
On the Impact of Performance Faults in Modern Microprocessors. J. Electron. Test. 29(3): 351-366 (2013) - [j4]Naghmeh Karimi, Krishnendu Chakrabarty:
Detection, Diagnosis, and Recovery From Clock-Domain Crossing Failures in Multiclock SoCs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(9): 1395-1408 (2013) - [c14]Ozgur Sinanoglu, Naghmeh Karimi, Jeyavijayan Rajendran, Ramesh Karri, Yier Jin, Ke Huang, Yiorgos Makris:
Reconciling the IC test and security dichotomy. ETS 2013: 1-6 - [c13]Jennifer Dworak, Ronald Shawn Blanton, Masahiro Fujita, Kazumi Hatayama, Naghmeh Karimi, Michail Maniatakos, Antonis M. Paschalis, Adit D. Singh, Tian Xia:
Special session 4B: Elevator talks. VTS 2013: 1 - 2012
- [c12]Naghmeh Karimi, Krishnendu Chakrabarty, Pallav Gupta, Srinivas Patil:
Test generation for clock-domain crossing faults in integrated circuits. DATE 2012: 406-411 - 2011
- [j3]Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris:
Instruction-Level Impact Analysis of Low-Level Faults in a Modern Microprocessor Controller. IEEE Trans. Computers 60(9): 1260-1273 (2011) - [j2]Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Chandra Tirumurti, Yiorgos Makris:
Workload-Cognizant Concurrent Error Detection in the Scheduler of a Modern Microprocessor. IEEE Trans. Computers 60(9): 1274-1287 (2011) - [c11]Naghmeh Karimi, Zhiqiu Kong, Krishnendu Chakrabarty, Pallav Gupta, Srinivas Patil:
Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip. Asian Test Symposium 2011: 7-14
2000 – 2009
- 2009
- [c10]Naghmeh Karimi, Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris:
Impact analysis of performance faults in modern microprocessors. ICCD 2009: 91-96 - [c9]Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris:
Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller. VTS 2009: 9-14 - 2008
- [j1]Naghmeh Karimi, Armin Alaghi, Mahshid Sedghi, Zainalabedin Navabi:
Online Network-on-Chip Switch Fault Detection and Diagnosis Using Functional Switch Faults. J. Univers. Comput. Sci. 14(22): 3716-3736 (2008) - [c8]Michail Maniatakos, Naghmeh Karimi, Yiorgos Makris, Abhijit Jas, Chandra Tirumurti:
Design and Evaluation of a Timestamp-Based Concurrent Error Detection Method (CED) in a Modern Microprocessor Controller. DFT 2008: 454-462 - [c7]Armin Alaghi, Mahshid Sedghi, Naghmeh Karimi, Mahmood Fathy, Zainalabedin Navabi:
Reliable NoC architecture utilizing a robust rerouting algorithm. EWDTS 2008: 200-203 - [c6]Naghmeh Karimi, Soheil Aminzadeh, Saeed Safari, Zainalabedin Navabi:
A Novel GA-Based High-Level Synthesis Technique to Enhance RT-Level Concurrent Testing. IOLTS 2008: 173-174 - [c5]Armin Alaghi, Mahshid Sedghi, Naghmeh Karimi, Zainalabedin Navabi:
NoC Reconfiguration for Utilizing the Largest Fault-free Connected Sub-structure. ITC 2008: 1 - [c4]Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Yiorgos Makris:
On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. ITC 2008: 1-10 - 2007
- [c3]Armin Alaghi, Naghmeh Karimi, Mahshid Sedghi, Zainalabedin Navabi:
Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Mode. DFT 2007: 21-30 - [c2]Naghmeh Karimi, Shahrzad Mirkhani, Zainalabedin Navabi, Fabrizio Lombardi:
RT level reliability enhancement by constructing dynamic TMRS. ACM Great Lakes Symposium on VLSI 2007: 172-175 - 2006
- [c1]Naghmeh Karimi, Shahrzad Mirkhani, Zainalabedin Navabi:
ESTA: An Efficient Method for Reliability Enhancement of RT-Level Designs. ATS 2006: 195-202
Coauthor Index
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