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ORCIDAnne E. Gattiker
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2010 – 2019
- 2019
[j12]Jinho Lee
, Inseok Hwang, Thomas Hubregtsen, Anne E. Gattiker, Christopher M. Durham:
Accelerating Conversational Agents Built With Off-the-Shelf Modularized Services. IEEE Pervasive Comput. 18(2): 47-57 (2019)- [c31]Mayoore Jaiswal, H. Peter Hofstee, Valerie Chen, Suvadip Paul, Rogério Feris, Frank Liu, Anupama Jagannathan, Anne Gattiker, Inseok Hwang, Jinho Lee, Matthew Tong, Sahil Dureja, Soham Shah:
Video-Text Compliance: Activity Verification Based on Natural Language Instructions. ICCV Workshops 2019: 1503-1512 - 2018
- [i1]Minh N. B. Nguyen, Samuel Thomas, Anne E. Gattiker, Sujatha Kashyap, Kush R. Varshney:
SimplerVoice: A Key Message & Visual Description Generator System for Illiteracy. CoRR abs/1811.01299 (2018) - 2017
- [c30]Jinho Lee, Inseok Hwang, Thomas Hubregtsen, Anne E. Gattiker, Christopher M. Durham:
SCI-FII: Speculative Conversational Interface Framework for Incremental Inference on Modularized Services. MDM 2017: 278-285 - 2015
- [j11]Eric J. Fluhr, Steve Baumgartner, David W. Boerstler, John F. Bulzacchelli, Timothy Diemoz, Daniel Dreps, George English, Joshua Friedrich, Anne Gattiker, Tilman Gloekler, Christopher J. Gonzalez, Jason Hibbeler, Keith A. Jenkins, Yong Kim, Paul Muench, Ryan Nett, Jose Paredes, Juergen Pille, Donald W. Plass, Phillip J. Restle, Raphael Robertazzi, David Shan, David W. Siljenberg, Michael A. Sperling, Kevin Stawiasz, Gregory S. Still, Zeynep Toprak Deniz, James D. Warnock, Glen A. Wiedemeier, Victor V. Zyuban:
The 12-Core POWER8™ Processor With 7.6 Tb/s IO Bandwidth, Integrated Voltage Regulation, and Resonant Clocking. IEEE J. Solid State Circuits 50(1): 10-23 (2015) - 2014
- [j10]James D. Warnock, Yuen H. Chan, Hubert Harrer, Sean M. Carey, Gerard Salem, Doug Malone, Ruchir Puri, Jeffrey A. Zitz, Adam Jatkowski, Gerald Strevig, Ayan Datta, Anne Gattiker, Aditya Bansal, Guenter Mayer, Yiu-Hing Chan, Mark D. Mayo, David L. Rude, Leon J. Sigal, Thomas Strach, Howard H. Smith, Huajun Wen, Pak-kin Mak, Chung-Lung Kevin Shum, Donald W. Plass, Charles F. Webb:
Circuit and Physical Design of the zEnterprise™ EC12 Microprocessor Chips and Multi-Chip Module. IEEE J. Solid State Circuits 49(1): 9-18 (2014) - [c29]Anne Gattiker:
Big data and test. ITC 2014: 1 - [c28]Anne Gattiker:
Unstructured text: Test analysis techniques applied to non-test problems. VTS 2014: 1-4 - 2013
- [j9]Anne E. Gattiker, Fadi H. Gebara, H. Peter Hofstee, J. D. Hayes, A. Hylick:
Big Data text-oriented benchmark creation for Hadoop. IBM J. Res. Dev. 57(3/4): 10 (2013) - [c27]Thomas H. Osiecki, Min-Yu Tsai, Anne E. Gattiker, Damir A. Jamsek, Sani R. Nassif, William Evan Speight, Cliff C. N. Sze:
Hardware Acceleration of an Efficient and Accurate Proton Therapy Monte Carlo. ICCS 2013: 2241-2250 - [c26]James D. Warnock, Yuen H. Chan, Hubert Harrer, David L. Rude, Ruchir Puri, Sean M. Carey, Gerard Salem, Guenter Mayer, Yiu-Hing Chan, Mark D. Mayo, Adam Jatkowski, Gerald Strevig, Leon J. Sigal, Ayan Datta, Anne Gattiker, Aditya Bansal, Doug Malone, Thomas Strach, Huajun Wen, Pak-kin Mak, Chung-Lung Kevin Shum, Donald W. Plass, Charles F. Webb:
5.5GHz system z microprocessor and multi-chip module. ISSCC 2013: 46-47 - 2012
- [j8]Anne E. Gattiker, Phil Nigh:
Guest Editors' Introduction: Yield Learning Processes and Methods. IEEE Des. Test Comput. 29(1): 6-7 (2012) - [c25]Eun Jung Jang, Anne Gattiker, Sani R. Nassif, Jacob A. Abraham:
An oscillation-based test structure for timing information extraction. VTS 2012: 74-79 - 2011
- [c24]Eun Jung Jang, Jaeyong Chung, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham:
Post-Silicon Timing Validation Method Using Path Delay Measurements. Asian Test Symposium 2011: 232-237 - [c23]Anne E. Gattiker, Phil Nigh:
Using well/substrate bias manipulation to enhance voltage-test-based defect detection. ITC 2011: 1-6 - [c22]Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham:
Efficient and product-representative timing model validation. VTS 2011: 90-95 - [c21]Anne Gattiker:
Invited paper: Yin and Yang of embedded sensors for post-scaling-era. VTS 2011: 324-327 - 2010
- [c20]Anne Gattiker:
System-level impact of chip-level failure mechanisms and screens. ICCAD 2010: 173-176
2000 – 2009
- 2008
- [c19]Anne Gattiker:
Using test data to improve IC quality and yield. ICCAD 2008: 771-777 - [c18]Anne Gattiker:
Unraveling Variability for Process/Product Improvement. ITC 2008: 1-9 - 2007
- [j7]Anne Gattiker:
Guest Editor's Introduction: Getting More Out of Test. IEEE Des. Test Comput. 24(5): 474-475 (2007) - 2006
- [j6]Anne E. Gattiker:
Getting More out of ITC. IEEE Des. Test Comput. 23(5): 432 (2006) - [j5]Kerry Bernstein, David J. Frank, Anne E. Gattiker, Wilfried Haensch, Brian L. Ji, Sani R. Nassif, Edward J. Nowak, Dale J. Pearson, Norman J. Rohrer:
High-performance CMOS variability in the 65-nm regime and beyond. IBM J. Res. Dev. 50(4-5): 433-450 (2006) - [c17]Anne E. Gattiker:
IC failure mechanisms yesterday, today, tomorrow: implications from test to DFM. ISPD 2006: 47 - [c16]Anne Gattiker, Manjul Bhushan, Mark B. Ketchen:
Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment. ITC 2006: 1-10 - [e1]Scott Davidson, Anne Gattiker:
2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. IEEE Computer Society 2006, ISBN 1-4244-0292-1 [contents] - 2004
- [c15]Phil Nigh, Anne E. Gattiker:
Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. ITC 2004: 309-318 - [c14]Anne E. Gattiker:
Diagnosis Meets Physical Failure Analysis: How Long can we Succeed? ITC 2004: 1441 - 2003
- [j4]James F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker:
Power supply transient signal analysis for defect-oriented test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(3): 370-374 (2003) - [c13]Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey:
Deformations of IC Structure in Test and Yield Learning. ITC 2003: 856-865 - 2002
- [j3]Pranab K. Nag, Anne E. Gattiker, Sichao Wei, Ronald D. Blanton, Wojciech Maly:
Modeling the Economics of Testing: A DFT Perspective. IEEE Des. Test Comput. 19(1): 29-41 (2002) - [c12]Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long:
Static timing analysis based circuit-limited-yield estimation. ISCAS (5) 2002: 81-84 - [c11]Duane S. Boning, Joseph Panganiban, Karen Gonzalez-Valentin, Sani R. Nassif, Chandler McDowell, Anne E. Gattiker, Frank Liu:
Test structures for delay variability. Timing Issues in the Specification and Synthesis of Digital Systems 2002: 109 - [c10]Abhishek Singh, Jim Plusquellic, Anne E. Gattiker:
Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models. VTS 2002: 357-366 - 2001
- [c9]Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long:
Timing Yield Estimation from Static Timing Analysis. ISQED 2001: 437-442 - [c8]Abhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker:
Detecting delay faults using power supply transient signal analysis. ITC 2001: 395-404 - 2000
- [c7]Phil Nigh, Anne E. Gattiker:
Test method evaluation experiments and data. ITC 2000: 454-463
1990 – 1999
- 1998
- [c6]Anne E. Gattiker, Wojciech Maly:
Toward understanding "Iddq-only" fails. ITC 1998: 174-183 - [c5]Anne E. Gattiker, Wojciech Maly:
Current signatures: application [to CMOS]. ITC 1998: 1168-1177 - 1997
- [j2]Anne E. Gattiker, Wojciech Maly:
Smart Substrate MCMs. J. Electron. Test. 10(1-2): 39-53 (1997) - [c4]Anne E. Gattiker, Wojciech Maly:
Current Signatures: Application. ITC 1997: 156-165 - [c3]Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly:
To DFT or Not to DFT? ITC 1997: 557-566 - 1996
- [c2]Anne E. Gattiker, Wojciech Maly:
Current signatures [VLSI circuit testing]. VTS 1996: 112-117 - 1994
- [j1]Wojciech Maly, Derek B. I. Feltham, Anne E. Gattiker, Mark D. Hobaugh, Kenneth Backus, Michael E. Thomas:
Smart-Substrate Multichip-Module Systems. IEEE Des. Test Comput. 11(2): 64-73 (1994) - [c1]Anne E. Gattiker, Wojciech Maly:
Feasibility Study of Smart Substrate Multichip Modules. ITC 1994: 41-49
Coauthor Index
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