"Power supply transient signal analysis for defect-oriented test."

James F. Plusquellic et al. (2003)

> Home

Details and statistics

DOI: 10.1109/TCAD.2002.807896

access: closed

type: Journal Article

metadata version: 2020-09-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/PlusquellicSPG03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/PlusquellicSPG03
James F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker:
Power supply transient signal analysis for defect-oriented test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(3): 370-374 (2003)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.