"Modeling the Economics of Testing: A DFT Perspective."

Pranab K. Nag et al. (2002)

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DOI: 10.1109/54.980051

access: closed

type: Journal Article

metadata version: 2020-05-17

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  - https://dblp.org/rec/journals/dt/NagGWBM02
Pranab K. Nag, Anne E. Gattiker, Sichao Wei, Ronald D. Blanton, Wojciech Maly:
Modeling the Economics of Testing: A DFT Perspective. IEEE Des. Test Comput. 19(1): 29-41 (2002)

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