• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 55 matches

• 2008
• 
  Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak:
  Reducing Scan Shift Power at RTL. VTS 2008: 139-146
• 
  Uranmandakh Amgalan, Christian Hachmann, Sybille Hellebrand, Hans-Joachim Wunderlich:
  Signature Rollback - A Technique for Testing Robust Circuits. VTS 2008: 125-130
• 
  Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
  Full Open Defects in Nanometric CMOS. VTS 2008: 119-124
• 
  Sudarshan Bahukudumbi, Krishnendu Chakrabarty:
  Test-Pattern Ordering for Wafer-Level Test-During-Burn-In. VTS 2008: 193-198
• 
  Sounil Biswas, R. D. (Shawn) Blanton:
  Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data. VTS 2008: 299-308
• 
  Anshuman Chandra, Rohit Kapur:
  Bounded Adjacent Fill for Low Capture Power Scan Testing. VTS 2008: 131-138
• 
  Tze Wee Chen, Kyunglok Kim, Young Moon Kim, Subhasish Mitra:
  Gate-Oxide Early Life Failure Prediction. VTS 2008: 111-118
• 
  Yao-Hsin Chou, Sy-Yen Kuo, I-Ming Tsai:
  QBIST: Quantum Built-in Self-Test for any Boolean Circuit. VTS 2008: 261-266
• 
  Kyriakos Christou, Maria K. Michael, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda:
  A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions. VTS 2008: 389-394
• 
  Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang:
  An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. VTS 2008: 73-78
• 
  James Dardig, Haralampos-G. D. Stratigopoulos, Eric Stern, Mark A. Reed, Yiorgos Makris:
  A Statistical Approach to Characterizing and Testing Functionalized Nanowires. VTS 2008: 267-274
• 
  Qingqi Dou, Jacob A. Abraham:
  Low-cost Test of Timing Mismatch Among Time-Interleaved A/D Converters in High-speed Communication Systems. VTS 2008: 3-8
• 
  Erdem Serkan Erdogan, Sule Ozev:
  Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers. VTS 2008: 209-214
• 
  François-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh:
  How Many Test Patterns are Useless? VTS 2008: 23-28
• 
  Ritesh Garg, Richard Putman, Nur A. Touba:
  Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation. VTS 2008: 35-42
• 
  Emil Gizdarski:
  Constructing Augmented Multimode Compactors. VTS 2008: 29-34
• 
  Manoj Kumar Goparaju, Spyros Tragoudas:
  A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates. VTS 2008: 323-328
• 
  Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
  An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories. VTS 2008: 95-100
• 
  Masoud Hashempour, Zahra Mashreghian Arani, Fabrizio Lombardi:
  A Metric for Assessing the Error Tolerance of Tile Sets for Punctured DNA Self-Assemblies. VTS 2008: 275-282
• 
  Dongwoo Hong, Kwang-Ting (Tim) Cheng:
  Bit-Error Rate Estimation for Bang-Bang Clock and Data Recovery Circuit in High-Speed Serial Links. VTS 2008: 17-22
• 
  I-De Huang, Yi-Shing Chang, Sandeep K. Gupta, Sreejit Chakravarty:
  An Industrial Case Study of Sticky Path-Delay Faults. VTS 2008: 395-402
• 
  Byoungho Kim, Nash Khouzam, Jacob A. Abraham:
  Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. VTS 2008: 293-298
• 
  King Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman:
  Diagnosis of Scan Clock Failures. VTS 2008: 67-72
• 
  Jaekwang Lee, Intaik Park, Edward J. McCluskey:
  Error Sequence Analysis. VTS 2008: 255-260
• 
  Jeremy Lee, Mohammad Tehranipoor:
  LS-TDF: Low-Switching Transition Delay Fault Pattern Generation. VTS 2008: 227-232
• 
  Chen-Wei Lin, Jiun-Lang Huang:
  A Built-In TFT Array Charge-Sensing Technique for System-on-Panel Displays. VTS 2008: 169-174
• 
  Carlos Arthur Lang Lisbôa, Costas Argyrides, Dhiraj K. Pradhan, Luigi Carro:
  Algorithm Level Fault Tolerance: A Technique to Cope with Long Duration Transient Faults in Matrix Multiplication Algorithms. VTS 2008: 363-370
• 
  Apurva Mishra, Mani Soma:
  A Time-Domain Method for Pseudo-Spectral Characterization. VTS 2008: 163-168
• 
  Niladri Narayan Mojumder, Saibal Mukhopadhyay, Jae-Joon Kim, Ching-Te Chuang, Kaushik Roy:
  Design and Analysis of a Self-Repairing SRAM with On-Chip Monitor and Compensation Circuitry. VTS 2008: 101-106
• 
  Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee:
  ACT: Adaptive Calibration Test for Performance Enhancement and Increased Testability of Wireless RF Front-Ends. VTS 2008: 215-220

skipping 25 more matches